Rapidly solidified amorphous and crystalline alloys : proceedings of the Materials Research Society Annual Meeting, November 1981, Boston Park Plaza Hotel, Boston, Massachusetts, U.S.A.. pp.205-210, 1982. New York. North-Holland
Ito, H. ; Suzuki, T. ; Nobue, M. ; Nishihara, Y. ; Sakai, Y. ; Ozawa, T. ; Tomiyama, S.
Pub. info.:
Amorphous silicon semiconductors -- Pure and hydrogenated : symposium held April 21-24, 1987, Anaheim, California, U.S.A.. pp.437-444, 1987. Pittsburgh, Pa.. Materials Research Society
Materials issues in applications of amorphous silicon technology : symposium held April 15-17, 1985, San Francisco, California, U.S.A.. pp.417-422, 1985. Pittsburgh, Pa.. Materials Research Society
Yamada, T. ; Takahashi, M. ; Ozawa, T. ; Tawara, S. ; Goto, T.
Pub. info.:
Nano- and Microtechnology: Materials, Processes, Packaging, and Systems. pp.105-112, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Hagiwara, R. ; Yasaka, A. ; Aita, K. ; Takaoka, O. ; Koyama, Y. ; Kozakai, T. ; Doi, T. ; Muramatsu, M. ; Suzuki, K. ; Sugiyama, Y. ; Matsuda, O. ; Okabe, M. ; Shinohara, S. ; Hasuda, M. ; Adachi, T. ; Morikawa, Y. ; Nishiguchi, M. ; Sato, Y. ; Hayashi, N. ; Ozawa, T. ; Tanaka, Y. ; Yoshioka, N.
Pub. info.:
Photomask and Next-Generation Lithography Mask Technology X. pp.510-519, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Kawabata, K.S. ; Ebizuka, N. ; Sasaki, T. ; Sekiguchi, K. ; Lye, M. ; Aoki, K. ; Asai, R. ; Inata, M. ; Kashikawa, N. ; Kosugi, G. ; Ohyama, Y. ; Okita, K. ; Ozawa, T. ; Saito, Y. ; Shimizu, Y. ; Taguchi, H. ; Takata, T. ; Yakoumaru, Y. ; Yoshida, M.
Pub. info.:
Instrument Design and Performance for Optical/Infrared Ground-based Telescopes. Part Three pp.1219-1228, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering