Shibata, R. ; Ogasaka, Y. ; Tamura, K. ; Furuzawa, A. ; Tawara, Y. ; Yamashita, K. ; Takahashi, R. ; Sakashita, M. ; Miyazawa, T. ; Shimoda, K. ; Sakai, C. ; Yamada, N. ; Naitou, M. ; Futamura, T. ; Serlemitsos, P. J. ; Soong, Y. ; Chan, K. -W. ; Okajima, T. ; Tueller, J. ; Krimm, H. A. ; Barthelmy, S. D. ; Owens, S. M. ; Kunieda, H. ; Namba, Y.
Pub. info.:
UV and gamma-ray space telescope systems : 21-24 June 2004, Glasgow, Scotland, United Kingdom. pp.312-324, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Laser-generated, synchrotron, and other laboratory X-ray and EUV sources, optics, and applications II : 2-4 August 2005, San Diego, California, USA. pp.591807-591807, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Owens, S. M. ; Gum, J. S. ; Tarrio, C. ; Grantham, S. ; Dvorak, J. ; Kjornrattanawanich, B. ; Keski-Kuha, R. ; Thomas, R. J. ; Konkelborg, C. C.
Pub. info.:
Optics for EUV, x-ray, and gamma-ray astronomy II : 3-4 August 2005, San Diego, California, USA. pp.590003-590003, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Hofmann, F. A. ; Gao, N. ; Owens, S. M. ; Gibson, W. M. ; MacDonald, C. A. ; Lee, S. M.
Pub. info.:
In situ process diagnostics and intelligent materials processing : symposium held December 2-5, 1997, Boston, Massachusetts, U.S.A.. pp.133-, 1998. Warrendale, Pa.. MRS - Materials Research Society
Owens, S. M. ; Meagher, T. ; Hadjimichael, T. ; Lehan, J. P. ; Content, D. A. ; Saha, T. ; Zhang, W. W. ; Petre, R. ; Reid, P. ; Jones, W. D. ; O’Dell, S.
Pub. info.:
Space Telescopes and Instrumentation II: Ultraviolet to Gamma Ray. pp.62661W-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering