1.

Conference Proceedings
Conference Proceedings
1. EFFECT OF OXIDE THICKNESS ON DIELECTRIC BREAKDOWN INDUCED BY SURFACE COP
Yamabe, K. ; Shimada, Y. ; Piao, M. ; Yarnazaki, T. ; Otsuki, T. ; Takeda, R. ; Obta, Y. ; Jimbo, S. ; Watanabe, M.
Pub. info.: Semiconductor silicon 2002 : proceedings of the ninth International Symposium on Silicon Materials Science and Technology.  pp.898-905,  2002.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2002-2
2.

Conference Proceedings
Conference Proceedings
2. EFFECT OF OXIDE THICKNESS ON DIELECTRIC BREAKDOWN INDUCED BY SURFACE COP
Yamabe, K. ; Shimada, Y. ; Piao, M. ; Yarnazaki, T. ; Otsuki, T. ; Takeda, R. ; Obta, Y. ; Jimbo, S. ; Watanabe, M.
Pub. info.: Semiconductor silicon 2002 : proceedings of the ninth International Symposium on Silicon Materials Science and Technology.  pp.898-905,  2002.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2002-2
3.

Conference Proceedings
Conference Proceedings
3. UV Light Induced Change of Anodic Oxide Films on Titanium in Acidic Sulfate Solution
Ohtsuka, T. ; Otsuki, T.
Pub. info.: Passivity and localized corrosion : an international symposium in honor of professor Norio Sato.  pp.330-336,  1999.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 99-27
4.

Technical Paper
Technical Paper
4. Studies on Bypass Transition of a Boundary Layer Subjected to Localized Periodic External Disturbances.
Funazaki, K. ; Wakita, Y. ; Otsuki, T.
Pub. info.: A.S.M.E. paper.  2004.  New York, NY.  American Society of Mechanical Engineers
Title of ser.: ASME Technical Paper : GT
Ser. no.: 2004