1.

Conference Proceedings
Conference Proceedings
1. Intrinsic Defects in ZnSe,ZnTe and CdS Doped with Li
Wolf,H. ; Jost,A. ; Lermen,R. ; Filz,T. ; Ostheimer,V. ; Wichert,Th.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.321-326,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201
2.

Conference Proceedings
Conference Proceedings
2. Defect struetures in heavily In-doped II-VI semiconductors
Ostheimer,V. ; Fiiz,T. ; Hamann,J. ; Lauer,St. ; Weber,D. ; Wolf,H. ; Wichert,Th.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part3  pp.1341-1346,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
3.

Conference Proceedings
Conference Proceedings
3. Doping of ZnSe,ZnTe and CdTe with Group V Elements
Wolf,H. ; Burchard,A. ; Deicher,M. ; Filz,T. ; Jost,A. ; Lauer,St. ; Magerle,R. ; Ostheimer,V. ; Pfeiffer,W. ; Wichert,Th.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.309-314,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201