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Conference Proceedings
Conference Proceedings
1. Electrical and Optical Characterisation of High Voltage 4H Silicon Carbide Diodes
Hallen, A. ; Zimmermann, U. ; Osterman, J. ; Galeckas, A. ; Linnros, J. ; Breitholtz, B.
Pub. info.: Compound semiconductor power transistors II : proceedings of the second international symposium and state-of-the-art program on compound semiconductors (SOTAPOCS XXXII) : proceedings of the thirty-second international symposium.  pp.82-89,  2000.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2000-1
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Conference Proceedings
Conference Proceedings
2. The Deep Boron Level in High-Voltage PiN Diodes
Stadler, W. ; Hallen, A. ; Osterman, J. ; Zimmermann, U. ; Svensson, B.G.
Pub. info.: Silicon carbide and related materials 2001 : ICSCRM2001, proceedings of the International Conference on Silicon Carbide and Related Materials 2001, Tsukuba, Japan, October 28-November 2, 2001.  pp.1309-1312,  2002.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 389-393
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Conference Proceedings
Conference Proceedings
3. Electrical Characterization of High-Voltage 4H-SiC Diodes on High-Temperature CVD-Grown Epitaxial Layers
Zimmermann, U. ; Osterman, J. ; Zhang, J. ; Henry, A. ; Hallen, A.
Pub. info.: Silicon carbide and related materials 2001 : ICSCRM2001, proceedings of the International Conference on Silicon Carbide and Related Materials 2001, Tsukuba, Japan, October 28-November 2, 2001.  pp.1285-1288,  2002.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 389-393
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Conference Proceedings
Conference Proceedings
4. Electron Beam Induced Current Investigation of High-Voltage 4H Silicon Carbide Diodes
Osterman, J. ; Hallen, A. ; Jargelius, M. ; Zimmermann, U. ; Galeckas, A. ; Breitholtz, B.
Pub. info.: Silicon carbide and related materials - 1999 : ICSCRM'99, proceedings of the International Conference on Silicon Carbide and Related Materials - 1999, Research Triangle Park, North Carolina, USA, October 10-15, 1999.  pp.777-780,  2000.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 338-342(1)
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Conference Proceedings
Conference Proceedings
5. SEM Visibility of Stacking Faults in 4H-Silicon Carbide Epitaxial and Implanted Layers
Zimmermann, U. ; Osterman, J. ; Galeckas, A. ; Hallen, A.
Pub. info.: Silicon carbide and related materials 2002 : ECSCRM2002, proceedings of the 4th European Conference on Silicon Carbide and Related Materials, September 2-5, 2002, Linköping, Sweden.  pp.937-940,  2003.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 433-436
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Conference Proceedings
Conference Proceedings
6. Carrier Concentrations in Implanted and Epitaxial 4H-SiC by Scanning Spreading Resistance Microscopy
Osterman, J. ; Anand, S. ; Linnarsson, M.K. ; Hallen, A.
Pub. info.: Silicon carbide and related materials 2001 : ICSCRM2001, proceedings of the International Conference on Silicon Carbide and Related Materials 2001, Tsukuba, Japan, October 28-November 2, 2001.  pp.663-666,  2002.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 389-393