1.

Conference Proceedings

Conference Proceedings
Ostapenko,S.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part1  pp.197-202,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
2.

Conference Proceedings

Conference Proceedings
Koshka,Y. ; Ostapenko,S. ; jastrzebski,L. ; Cao,J. ; Kaleis,J.P.
Pub. info.: In-Line Characterization Techniques for Performance and Yield Enhancement in Microelectronic Manufacturing.  pp.41-48,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3215
3.

Conference Proceedings

Conference Proceedings
Ostapenko,S. ; Koshka,Y. ; Jastrzebski,L. ; Smeltzer,R.K.
Pub. info.: Active matrix liquid crystal displays technology and applications : 10-11 February, 1997, San Jose, California.  pp.176-183,  1997.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3014
4.

Conference Proceedings

Conference Proceedings
Tarasov,I. ; Ostapenko,S. ; Haessler,C. ; Raisner,E.-U.
Pub. info.: Analytical and diagnostic techniques for semiconductor materials, devices and processes : joint proceedings of the symposia on ALTECH 99, satellite symposium to ESSDERC 99, Leuven, Belgium [and] the Electrochemical Society Symposium on Diagnostic Techniques for Semiconductor Materials and Devices.  pp.433-440,  1999.  Pennington, N.J..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3895
5.

Conference Proceedings

Conference Proceedings
Belyaev,A. ; Tarasov,I. ; Ostapenko,S. ; Koveshnikov,S. ; Kochelap,V.A. ; Beyaev,A.E.
Pub. info.: High Purity Silicon VI : proceedings of the sixth International Symposium.  4218  pp.660-669,  2000.  Pennington, N.J., Bellingham, Wash..  Electrochemical Society — SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4218