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14 results

Conference Proceedings

1. Degradation and recovery of alpha ray irradiated MOSFETs on SIMOX

Ohyama, H. ; Simoen, E. ; Claeys, C. ; Takami, Y. ; Kawamura, K. ; Hakata, T. ; Sunaga, H. ; Ogita, Y.

Pub. info.:	Proceedings of the Eighth International Symposium on Silicon-on-Insulator Technology and Devices. pp.289-294, 1997. Pennington, NJ. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	97-23

Conference Proceedings

2. Electrical Conductivity of Rare Earth Aluminate

Kawamura, K. ; Ohyama, H. ; Ueda, M. ; Maruyama, T.

Pub. info.:	High temperature corrosion and materials chemistry : proceedings of the International Symposium. pp.195-202, 2005. Pennington, New Jersey. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	2004-16

Conference Proceedings

3. DEGRADATION AND RECOVERY OF BORON DOPED STRAINED SILICON GERMANIUM LAYERS AFTER 1-MeV ELECTRON IRRADIATION

Ohyama, H. ; Vanhellemont, J. ; Trauwaert, M.-A. ; Poortmans, J. ; Caymax, M. ; Clauws, P.

Pub. info.:	Semiconductor heterostructures for photonic and electronic applications : symposium held November 30-December 4, 1992, Boston, Massachusetts, U.S.A.. pp.433-438, 1993. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	281

Conference Proceedings

4. Proton irradiation induced lattice defects in Si diodes and their effects on device performance

Ohyama, H. ; Simoen, E. ; Claeys, C. ; Vanhellemont, J. ; Takami, Y. ; Hayama, T. ; Sunaga, H. ; Kobayashi, K.

Pub. info.:	Proceedings of the Symposium on Crystalline Defects and Contamination, their Impact and Control in Device Manufacturing II. pp.143-152, 1997. Pennington, NJ. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	97-22

Conference Proceedings

5. Radiation Source Dependence of Degradation in MOSFETS on SIMOX Substrate

Hakata, T. ; Ohyama, H. ; Simoen, E. ; Claeys, C. ; Takami, Y. ; Kawamura, K. ; Miyahara, K. ; Hososhima, M.

Pub. info.:	Semiconductors for room-temperature radiation detector applications II : symposium held December 1-5, 1997, Boston, Massachusetts, U.S.A.. pp.387-, 1997. Pittsburgh, PA. MRS - Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	487

Conference Proceedings

6. Radiation Damage of InGaAs Photodiodes by High-Energy Particles

Kudou, T. ; Ohyama, H. ; Simoen, E. ; Claeys, C. ; Takami, Y. ; Shigaki, K. ; Fujii, A. ; Sunaga, H.

Pub. info.:	Semiconductors for room-temperature radiation detector applications II : symposium held December 1-5, 1997, Boston, Massachusetts, U.S.A.. pp.471-, 1997. Pittsburgh, PA. MRS - Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	487

Conference Proceedings

7. Degradation and Recovery of Si Diodes by 20-MeV Protons and 220-MeV Carbon Particles

Hakata, T. ; Ohyama, H. ; Simoen, E. ; Claeys, C. ; Sunaga, H. ; Kobayashi, K. ; Hososhima, M.

Pub. info.:	Semiconductors for room-temperature radiation detector applications II : symposium held December 1-5, 1997, Boston, Massachusetts, U.S.A.. pp.435-, 1997. Pittsburgh, PA. MRS - Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	487

Conference Proceedings

8. Radiation Damage in Si Avalanche Photodiodes by 1-MeV Fast Neutrons and 220-MeV Carbon Particles

Ohyama, H. ; Hakata, T. ; Simoen, E. ; Claeys, C. ; Takami, Y. ; Hayama, K. ; Tokuyama, J. ; Shigaki, K. ; Kobayashi, K. ; Sunaga, H. ; Miyahara, K. ; Hososhima, M.

Pub. info.:	Semiconductors for room-temperature radiation detector applications II : symposium held December 1-5, 1997, Boston, Massachusetts, U.S.A.. pp.429-, 1997. Pittsburgh, PA. MRS - Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	487

Conference Proceedings

9. Degradation and Recovery of Si1-xGex Devices by Irradiation

Ohyama, H. ; Vanhellemont, J. ; Takami, Y. ; Hayama, K. ; Kudo, T. ; Hakata, T. ; Kobayashi, K. ; Sunaga, H. ; Hironaka, I. ; Poortmans, J. ; Caymax, M.

Pub. info.:	Strained layer epitaxy - materials processing and device applications : symposium held April 17-19, 1995, San Francisco, California, U.S.A.. pp.365-, 1995. Pittsburgh, PA. MRS - Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	379

10.

Conference Proceedings

10. Impact of the Ge Content on the Radiation Hardness of Heterojunction Diodes in SiGe Strained Layers

Ohyama, H. ; Simoen, E. ; Claeys, C. ; Takami, Y. ; Hayama, K. ; Hakata, T. ; Tokuyama, J. ; Kobayashi, K. ; Sunaga, H. ; Poortmans, J. ; Caymax, M.

Pub. info.:	Epitaxy and applications of si-based heterostructures : symposium held April 13-17, 1998, San Francisco, California, U.S.A.. pp.99-, 1998. Warrendale, Pa.. MRS - Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	533

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