Kanda, N. ; Furukawa, R. ; Ishibashi, M. ; Kunitomo, M. ; Homma, T. ; Takahashi, M. ; Uemura, T. ; Kanai, M. ; Kubo, M. ; Ogata, K. ; Yoshida, T. ; Yamamoto, H. ; Ohji, Y.
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Structure and electronic properties of ultrathin dielectric films on silicon and related structures : symposium held November 29-December 1, 1999, Boston, Massachusetts, U.S.A.. pp.129-, 2000. Warrendale, PA. MRS-Materials Research Society
Hirano, Y. ; Ipposhi, T. ; Thai, D. H. ; Iwamatsu, T. ; Ikeda, T. ; Tsujiuchi, M. ; Maegawa, S. ; Inuishi, M. ; Ohji, Y.
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Dielectrics for nanosystems: materials science, processing, reliability, and manufacturing : proceedings of the First international symposium. pp.60-64, 2004. Pennington, N.J.. Electrochemical Society