Ogushi, S. ; Reilly, N. ; Sadamitsu, S. ; Koike, Y. ; Sano, M.
Pub. info.:
Defect and impurity engineered semiconductors, II : symposium held April 13-17, 1998, San Francisco, California, U.S.A.. pp.227-, 1998. Warrendale, Pa. MRS - Materials Research Society