1.

Conference Proceedings

Conference Proceedings
Hirabayashi,A. ; Ogawa,H. ; Kitagawa,K.
Pub. info.: Optical manufacturing and testing IV : 31 July-2 August 2001, San Diego, USA.  pp.356-367,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4451
2.

Conference Proceedings

Conference Proceedings
Shirota,Y. ; Noda,T. ; Ogawa,H.
Pub. info.: Organic light-emitting materials and devices III : 19-21 July 1999, Denver, Colorado.  pp.158-169,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3797
3.

Conference Proceedings

Conference Proceedings
Nishio,M. ; Hayashida,K. ; Harada,H. ; Mitsuishi,Y. ; Guo,Q. ; Ogawa,H.
Pub. info.: Fourth International Conference on Thin Film Physics and Applications : 8-11 May 2000, Shanghai, China : proceedings.  pp.158-163,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4086
4.

Conference Proceedings

Conference Proceedings
Guo,Q. ; Matsuse,M. ; Nishio,M. ; Ogawa,H.
Pub. info.: Fourth International Conference on Thin Film Physics and Applications : 8-11 May 2000, Shanghai, China : proceedings.  pp.207-210,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4086
5.

Conference Proceedings

Conference Proceedings
Kuriyama,T. ; Ogawa,H. ; Hasebe,H. ; Takeuchi,K. ; Takatsu,H.
Pub. info.: Liquid crystals : 28-29 July 1997, San Diego, California.  pp.31-38,  1997.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3143
6.

Conference Proceedings

Conference Proceedings
Guo,Q. ; Nishio,M. ; Ogawa,H.
Pub. info.: Fourth International Conference on Thin Film Physics and Applications : 8-11 May 2000, Shanghai, China : proceedings.  pp.356-359,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4086
7.

Conference Proceedings

Conference Proceedings
Hayashida,K. ; Nishio,M. ; Mitsuishi,Y. ; Guo,Q. ; Ogawa,H.
Pub. info.: Fourth International Conference on Thin Film Physics and Applications : 8-11 May 2000, Shanghai, China : proceedings.  pp.248-251,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4086
8.

Conference Proceedings

Conference Proceedings
Guo,Q. ; Okada,A. ; Nishio,M. ; Ogawa,H.
Pub. info.: Fourth International Conference on Thin Film Physics and Applications : 8-11 May 2000, Shanghai, China : proceedings.  pp.68-71,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4086
9.

Conference Proceedings

Conference Proceedings
Nishio,M. ; Hayashida,K. ; Guo,Q. ; Ogawa,H.
Pub. info.: Advanced photonic sensors : Technology and applications, 8-10 Novenber 2000, Beijing, China.  pp.355-360,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4220
10.

Conference Proceedings

Conference Proceedings
Guo,Q. ; Nishio,M. ; Ogawa,H.
Pub. info.: Advanced photonic sensors : Technology and applications, 8-10 Novenber 2000, Beijing, China.  pp.361-367,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4220