1.

Conference Proceedings
Conference Proceedings
1. Nanometer Scale Domain Measurement of Ferroelectric Thin Films Using Scanning Nonlinear Dielectric Microscopy
Odagawa, Hiroyuki ; Matsuura, Kaori ; Cho, Yasuo
Pub. info.: Ferroelectric thin films IX : symposium held November 26-30, 2000, Boston, Massachusetts, U.S.A..  2001.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 655
2.

Conference Proceedings
Conference Proceedings
2. Development of Scanning Microwave Microscope for High-Throughput Characterization of Combinatorial Dielectric Thin Film
Okazaki, Noriaki ; Ahmet, Parhat ; Chikyow, Toyohiro ; Odagawa, Hiroyuki ; Cho, Yasuo ; Fukumura, Tomoteru ; Kawasaki, Masashi ; Ohtani, Makoto ; Koinuma, Hideomi ; Hasegawa, Tetsuya
Pub. info.: Combinatorial and artificial intelligence methods in materials science : symposium held November 26-29, 2001, Boston, Massachusetts, U.S.A.  pp.119-124,  2002.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 700
3.

Conference Proceedings
Conference Proceedings
3. Measurement of Three Dimensional Polarization Direction in Ferroelectric Thin Films Using Scanning Nonlinear Dielectric Microscopy With Rotating Electric Field
Odagawa, Hiroyuki ; Cho, Yasuo
Pub. info.: Ferroelectric thin films XI : symposium held December 2-5, 2002, Boston, Massachusetts, U.S.A..  pp.267-274,  2003.  Warrendale, Pa.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 748