1.

Conference Proceedings
Conference Proceedings
1. Oxide-Semiconductor Interface Characterization Using Kelvin Probe-AFM in Combination With Corona-Charge Deposition
Lagel, Bert ; Ayala, Maria D. ; Oborina, Elena ; Schlaf, Rudy
Pub. info.: Fundamentals of novel oxide/semiconductor interfaces : symposium held December 1-4, 2003, Boston, Massachusetts, U.S.A..  pp.89-94,  2004.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 786
2.

Conference Proceedings
Conference Proceedings
2. Effect Of Metallic Contamination On Interface Properties And Oxide Reliability
Oborina, Elena ; Campbell, Scott ; Hoff, Andrew M. ; Gilbert, Richard ; Persson, Eric ; Simpson, Darrell
Pub. info.: Silicon materials - processing characterization and reliability : symposium held April 1-5, 2002, San Francisco, California, U.S.A..  pp.651-656,  2002.  Warrendale.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 716