1.
Conference Proceedings |
Kubota, H. ; Numano, M. ; Amai, T. ; Miyashita, M. ; Samata, S. ; Matsushita, Y.
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2.
Conference Proceedings |
2. Experimental Study of Degradation of Mechanical Strength of Silicon Wafer Caused by LSI processes
Yagishita, A. ; Fujii, O. ; Numano, M. ; Kawamura, N. ; Iwase, M. ; Ushiku, Y. ; Arikado, T.
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3.
Conference Proceedings |
Samata, S. ; Numano, M. ; Amai, T. ; Matsushita, Y. ; Kobayashi, K. ; Yamamoto, A. ; Kawaguchi, T. ; Nadahara, S. ; Yamabe, K.
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