Nonlinear optical properties of organic materials X : 30 July-1 August 1997, San Diego, California. pp.222-232, 1997. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Diffractive and holographic technologies, systems, and spatical light modulators VI : 27-29 January 1999, San Jose, California. pp.81-91, 1999. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Organic photorefractives, photoreceptors, waveguides, and fibers : 21-23 July 1999, Denver, Colorado. pp.202-213, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Polymer photonic devices : 28-30 January 1998 San Jose, California. pp.2-13, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Design, manufacturing, and testing of planar optical waveguide devices : 1 August 2001 San Diego, USA. pp.19-28, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Design and manufacturing of WDM devices : 4-5 November 1997, Dallas, Texas. pp.161-174, 1998. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Organic photorefractives, photoreceptors, waveguides, and fibers : 21-23 July 1999, Denver, Colorado. pp.266-279, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Organic photonic materials and devices II : 24-26 January 2000, San Jose, USA. pp.12-26, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Advances in resist technology and processing XIII : 11-13 March 1996, San Clara, California. pp.754-769, 1996. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Metrology, Inspection, and Process Control for Microlithography X. pp.273-280, 1996. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering