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19 results

Conference Proceedings

1. Digital holographic data reconstruction with data compression

Nomura,T. ; Okazaki,A. ; Kameda,M. ; Morimoto,Y. ; Javidi,B.

Pub. info.:	Algorithms and systems for optical information processing V : 31 July-2 August, 2001, San Diego, [California] USA. pp.235-242, 2001. Bellingham, Washington. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4471

Conference Proceedings

2. Frequency domain methods in digital photoelasticity

Morimoto,Y. ; Nomura,T. ; Fujigaki,M. ; Matsui,R.

Pub. info.:	Second International Conference on Experimental Mechanics : 29 November-1 December 2000, Singapore. pp.117-122, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4317

Conference Proceedings

3. Position-sensing grating interferometer for a specular object: analysis considering the aberration

Kamiya,K. ; Nomura,T. ; Okuda,S. ; Tashiro,H. ; Yoshikawa,K.

Pub. info.:	Optical engineering for sensing and nanotechnology (ICOSN 2001) : 6-8 June 2001, Yokohama, Japan. pp.416-419, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4416

Conference Proceedings

4. Polarization encoding for optical security systems

Javidi,B. ; Nomura,T.

Pub. info.:	Algorithms, devices, and systems for optical information processing III : 20-21 July 1999, Denver, Colorado. pp.196-203, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3804

Conference Proceedings

5. Optical encryption using joint transform correlator architecture for robust alignment

Nomura,T. ; javidi,B.

Pub. info.:	Algorithms, devices, and systems for optical information processing III : 20-21 July 1999, Denver, Colorado. pp.180-187, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3804

Conference Proceedings

6. Improvement of precision in the analysis of a lateral shearing interferogram using integration

Okuda,S. ; Nomura,T. ; Kamiya,K. ; Miyashiro,H. ; Yoshikawa,K. ; Tashiro,H.

Pub. info.:	Optical engineering for sensing and nanotechnology (ICOSN '99) : 16-18 June 1999, Yokohama, Japan. pp.630-633, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3740

Conference Proceedings

7. Image sensing method and defect detection algorithm for a 256-Mb and 1-Gb DRAM mask inspection system

Inoue,H. ; Okuda,K. ; Nomura,T. ; Tsuchiya,H. ; Tabata,M.

Pub. info.:	Photomask and X-ray mask technology IV : 17-18 April, 1997, Kawasaki, Japan. pp.462-469, 1997. Bellingham, Washington. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3096

Conference Proceedings

8. New die-to-database mask inspection system with i-line optics for 256-Mb and 1-Gb DRAMs

Tabata,M. ; Yamashita,K. ; Tsuchiya,H. ; Nomura,T. ; Inoue,H. ; Watanabe,T. ; Tojo,T. ; Yoshino,H.

Pub. info.:	Photomask and X-ray mask technology IV : 17-18 April, 1997, Kawasaki, Japan. pp.415-422, 1997. Bellingham, Washington. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3096

Conference Proceedings

9. High-resolution DUV inspection system for 150-nm generation masks

Tabata,M. ; Tsuchiya,H. ; Sanada,Y. ; Nishizaka,T. ; Hirazawa,H. ; Kobayashi,N. ; Nagai,H. ; Watanabe,T. ; Oohashi,K. ; Inoue,H. ; Nomura,T. ; Ono,A.

Pub. info.:	19th Annual Symposium on Photomask Technology : 15-17 September 1999, Monterey, California. Part1 pp.138-146, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3873

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Conference Proceedings

10. Determination of white and 1/f FM noise components of semiconductor laser spectrum by a delayed self-heterodyne interferometer using short delay fiber

Islam,M.N. ; Nomura,T. ; Imai,M.M. ; Huda,Md.Q.

Pub. info.:	Design, fabrication, and characterization of photonic devices : 30 November-3 December 1999, Singapore. pp.328-332, 1999. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3896

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Author: Nomura,T.