1.

Conference Proceedings
Conference Proceedings
1. Electric field detector using electro-optic device
Lee,C. ; Jeon,Y. ; Jeong,D. ; Yune,I.-J. ; No,K.
Pub. info.: Optomechatronic systems II : 29-31 October 2001, Newton, USA.  pp.311-322,  2001.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4564
2.

Conference Proceedings
Conference Proceedings
2. Adaptive interferometer measurement of the piezoelectric and electro-optic coefficients of the spin-coated PZT thin films
Spirin,V.V. ; Lee,C. ; No,K. ; Sokolov,I.A.
Pub. info.: Smart structures and materials 1998 : Sensory phenomena and measurement instrumentation for smart structures and materials : 2-4 March 1998, San Diego, California.  pp.59-66,  1998.  Bellingham.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3330
3.

Conference Proceedings
Conference Proceedings
3. Stability of CrFx films for phase-shifting mask
Kim,E. ; Hong,S. ; Jiang,Z.-T. ; Lim,S. ; Woo,S.-G. ; Koh,Y.-B. ; No,K.
Pub. info.: Photomask and X-ray mask technology IV : 17-18 April, 1997, Kawasaki, Japan.  pp.294-297,  1997.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3096
4.

Conference Proceedings
Conference Proceedings
4. Simulation study and fabrication of high-transmittance attenuated phase-shifting mask
Kim,E. ; Hong,S. ; Moon,S. ; Kim,Y. ; Yoon,H. ; No,K.
Pub. info.: 19th Annual Symposium on Photomask Technology : 15-17 September 1999, Monterey, California.  Part2  pp.928-936,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3873
5.

Conference Proceedings
Conference Proceedings
5. Formation and observation of ferroelectric domains in PbZr1-xTixO3(PZT)thin films using atomic force microscopy
Shin,H. ; Lee,K. ; Lim,G. ; Jeon,J.U. ; Pak,Y.E. ; Hong,S. ; No,K.
Pub. info.: Smart structures and materials 1999 : Smart materials technologies : 3-4 March 1999, Newport Beach, California.  pp.94-102,  1999.  Bellingham.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3675
6.

Conference Proceedings
Conference Proceedings
6. Control and modeling of stress in multistacked polysilicon films considering oxidation effect
Lee,C.S. ; Jang,W.I. ; Choi,C.A. ; Hong,Y.S. ; Lee,J.H. ; No,K. ; Wee,D.M.
Pub. info.: Micromachining and microfabrication process technology IV : 21-22 September, 1998, Santa Clara, California.  pp.315-324,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3511
7.

Conference Proceedings
Conference Proceedings
7. Investigation on application of chromium-based materials to attenuated phase-shift masks for DUV exposure
Hong,S. ; Kim,E. ; Jiang,Z.-T. ; Bae,B.-S. ; No,K. ; Shin,W. ; Lim,S.-C. ; Woo,S.-G. ; Koh,Y.-B.
Pub. info.: Photomask and X-Ray Mask Technology III.  pp.134-137,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2793
8.

Conference Proceedings
Conference Proceedings
8. High transmittance attenuated phase shifting mask of chromium aluminum oxynitride
Choi,E. ; Kim,E. ; Kim,H. ; Kim,Y. ; Tian,H. ; No,K.
Pub. info.: 21st Annual BACUS Symposium on Photomask Technology.  4562  pp.1141-1150,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4562
9.

Conference Proceedings
Conference Proceedings
9. Measurement of the quadratic electro-optic coefficient of lead zirconate titanate thin film by a two-beam polarization interferometer
Spirin,V.V. ; Shlyagin,M.G. ; Miridonov,S.V. ; No,K.
Pub. info.: Smart Structures and Materials 1999: Sensory Phenomena and Measurement Instrumentation for Smart Structures and Materials.  pp.541-552,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3670