1.

Conference Proceedings
Conference Proceedings
1. Measuring the Adhesion of Diamond Thin Films to Substrates Using the Blister Test
Sizemore, Jim ; Hohlfelder, R. J. ; Vlassak, J. J. ; Nix, W. D.
Pub. info.: Mechanical behavior of diamond and other forms of carbon : symposium held April 17-21, 1995, San Francisco, California, U.S.A..  pp.197-208,  1995.  Pittsburgh.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 383
2.

Conference Proceedings
Conference Proceedings
2. MAGNETIC ANISOTROPY OF CRYSTALLINE DEFECTS
Clemens, B. M. ; White, R. L. ; Nix, W. D. ; Bain, J. A.
Pub. info.: Magnetic surfaces, thin films, and multilayers : symposium held April 29-May 2, 1991, Anaheim, California, U.S.A..  pp.459-464,  1992.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 231
3.

Conference Proceedings
Conference Proceedings
3. FINITE ELEMENT CALCULATIONS OF THERMAL STRESSES IN PASSIVATED AND UNPASSIVATED LINES BONDED TO SUBSTRATES
Sauter, Anne I. ; Nix, W. D.
Pub. info.: Thin films : stresses and mechanical properties II : symposium held April 16-19, 1990, San Francisco, California, U.S.A..  pp.15-20,  1990.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 188
4.

Conference Proceedings
Conference Proceedings
4. APPLICATION OF STRESS MEASUREMENT TO THE STUDY OF THERMALLY ACTIVATED PROCESSES IN THIN-FILM MATERIALS
von Preissig, F. J. ; Nix, W. D.
Pub. info.: Thin films : stresses and mechanical properties III : symposium held December 2-5, 1991, Boston, Massachusetts, U.S.A..  pp.207-214,  1992.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 239
5.

Conference Proceedings
Conference Proceedings
5. *MECHANISMS AND KINETICS OF MISFIT DISLOCATION FORMATION IN HETEROEPITAXIAL THIN FILMS
Nix, W. D. ; Noble, D. B. ; Turlo, J. F.
Pub. info.: Thin films : stresses and mechanical properties II : symposium held April 16-19, 1990, San Francisco, California, U.S.A..  pp.315-330,  1990.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 188
6.

Conference Proceedings
Conference Proceedings
6. Wafer curvature studies of strengthening mechanisms in thin films on substrates
Leung, O. S. ; Nix, W. D.
Pub. info.: Thin films - stresses and mechanical properties VIII : symposium held November 29-December 3, 1999, Boston, Massachusetts, U.S.A..  pp.51-,  2000.  Warrendale, Pa..  MRS-Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 594
7.

Conference Proceedings
Conference Proceedings
7. The strain gradient effects in micro-indentation hardness experiments
Xue, Z. ; Huang, Y. ; Gao, H. ; Nix, W. D.
Pub. info.: Multiscale phenomena in materials - experiments and modeling : sympoisum held November 30-December 2, 1999, Boston, Massachusetts, U.S.A..  pp.53-,  2000.  Warrendale, Pa..  MRS-Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 578
8.

Conference Proceedings
Conference Proceedings
8. A model for calculating substrate curvature during coalescence of Pt islands on an amorphous substrate
Phillips, M. A. ; Ramaswamy, V. ; Clemens, B. M. ; Nix, W. D.
Pub. info.: Multiscale phenomena in materials - experiments and modeling : sympoisum held November 30-December 2, 1999, Boston, Massachusetts, U.S.A..  pp.39-,  2000.  Warrendale, Pa..  MRS-Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 578
9.

Conference Proceedings
Conference Proceedings
9. An Analysis of Void Nucleation in Passivated Interconnect Lines Due to Vacancy Condensation and Interface Contamination
Gleixner, R. J. ; Nix, W. D.
Pub. info.: Materials reliability in microelectronics VI : symposium held April 8-12, 1996, San Francisco, California, U.S.A..  pp.475-,  1996.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 428
10.

Conference Proceedings
Conference Proceedings
10. An Examination of Mass Transport Paths in Conventional and Highly Textured Al-Cu Interconnect Lines
Gleixner, R. J. ; Kaneko, H. ; Matsuo, M. ; Toyoda, H. ; Nix, W. D.
Pub. info.: Polycrystalline thin films : structure, texture, properties and applications III : symposium held March 31-April 3, 1997, San Francisco, California, U.S.A..  pp.319-,  1997.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 472