1.

Conference Proceedings
Conference Proceedings
1. Hyper-numerical aperture imaging challenges for 193 nm
Mizoguchi, H. ; Inoue, T. ; Fujimoto, J. ; Yamazaki, T. ; Suzuki, T. ; Matsunaga, T. ; Sakanishi, S. ; Kaminishi, M. ; Watanabe, Y. ; Ohta, T. ; Nakane, M. ; Moriya, M. ; Nakaike, T. ; Shinbori, M. ; Yoshino, M. ; Kawasuji, T. ; Nogawa, H. ; Ito, T. ; Umeda, H. ; Tanaka, S. ; Taniguchi, H. ; Sasaki, Y. ; Kinoshita, J. ; Abe, T. ; Tanaka, H. ; Hayashi, H. ; Miyao, K. ; Niwano, M. ; Kurosu, A. ; Yashiro, M. ; Nagano, H. ; Matsui, N. ; Mimura, T. ; Kakizaki, K. ; Goto, M.
Pub. info.: Optical microlithography XVIII : 1-4 March, 2005, San Jose, California, USA.  pp.69-79,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5754
2.

Conference Proceedings
Conference Proceedings
2. Formation of Alkali- and Si-Endohedral Fullerenes Based on Plasma Technology.
Hatakeyama, R. ; Hirata, T. ; Sato, N. ; Mieno, T. ; Sato, N.Y. ; Oku, T. ; Mase, H. ; Niwano, M. ; Miyamoto, N.
Pub. info.: Fullerenes : fullerenes for the new millennium : proceedings of the International Symposium on Fullerenes, Nanotubes, and Carbon Nanoclusters.  pp.341-348,  2001.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2001-11
3.

Conference Proceedings
Conference Proceedings
3. In-Situ Infrared Observation of Etching and Oxidation Processes of Si Surface in NH4F Solution
Niwano, M. ; Kondo, Y. ; Kimura, Y.
Pub. info.: Spectroscopic tools for the analysis of electrochemical systems : proceedings of the international symposium.  pp.161-170,  1999.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 99-15
4.

Conference Proceedings
Conference Proceedings
4. Initial Stages of Etching of Si Electrode Surfaces Investigated by Surface Infrared Spectroscopy
Kimura, Y. ; Niwano, M.
Pub. info.: Pits and Pores : formation, properties, and significance for advanced materials : proceedings of the International Symposium.  pp.82-89,  2000.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2000-25
5.

Conference Proceedings
Conference Proceedings
5. Field Effect of Fullerene Thin Film Studied by Displacement Current Measurements and Infrared Absorption Spectroscopy in The Multiple Reflection Geometry
Ogawa, S. ; Kimura, Y. ; Ishii, H. ; Niwano, M.
Pub. info.: Organic and polymeric materials and devices : symposium held April 22-25, 2003, San Francisco, California, U.S.A..  pp.225-230,  2003.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 771
6.

Conference Proceedings
Conference Proceedings
6. Antioxidative and Anticancer Components Produced by Cell Culture of Sesame
Mimura, A. ; Takebayashi, K. ; Niwano, M. ; Takahara, Y. ; Osawa, Toshihiko ; Tokuda, H.
Pub. info.: Food phytochemicals for cancer prevention.  pp.281-,  1994.  Washington, D.C..  American Chemical Society
Title of ser.: ACS symposium series
Ser. no.: 547