1.

Conference Proceedings
Conference Proceedings
1. Spectroscopic Ellipsometry of Ta2O5 on Si
Richter, C. A. ; Nguyen, N. V. ; Alers, G. B.
Pub. info.: Ultrathin SiO[2] and high-K materials for USLI gate dielectrics : symposium held April 5-8, 1999, in San Francisco, California, U.S.A..  pp.559-,  1999.  Warrendale, PA.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 567
2.

Conference Proceedings
Conference Proceedings
2. INTERFACE ROUGHNESS-INDUCED CHANGES IN THE NEAR-E0 SPECTROSCOPIC BEHAVIOR OF SHORT-PERIOD AlAs/GaAs SUPERLATTICES
Chandler-Horowitz, D. ; Pellegrino, J. G. ; Nguyen, N. V. ; Amirtharaj, P. M. ; Qadri, S. B.
Pub. info.: Growth, processing, and characterization of semiconductor heterostructures : Symposium held November 29-December 2, 1993, Massachusetts, U.S.A..  pp.145-,  1994.  Pittsburgh.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 326