Blank Cover Image

Optical quantum information processing utilizing weak nonlinearities: a little goes a long way (Invited Paper) [5893-17]

Author(s):
Munro, W. J. ( Hewlett-Packard Labs. (United Kingdom) and National Institute of Informatics (Japan); )
Nermoto, K. ( National Institute of Informatics (Japan); )
Spiller, T. P> ( Hewlett-Packard Labs. (United Kingdom) )
Beausoleil, R. G. ( Hewlett-Packard Labs. (USA); )
Kok, P.
Barrett, S. D. ( Hewlett-Packard Labs. (United Kingdom) )
1 more
Publication title:
Quantum communications and quantum imaging III : 2-4 August 2005, San Diego, California, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5893
Pub. Year:
2005
Page(from):
58930I
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819458988 [0819458988]
Language:
English
Call no.:
P63600/5893
Type:
Conference Proceedings

Similar Items:

Beausoleil, R.G., Barrett, S.D., Kok, P., Nemoto, K., Munro, W.J., Spiller, T.P.

SPIE - The International Society of Optical Engineering

Munro, W. J., Nemoto, K., Spiller, T. P., van Lkoock, P., Braunstein, S. L., Milburn, G. J.

SPIE - The International Society of Optical Engineering

Florentino, M, Fattal, D. A., Santori, C. M., Spillane, S. M., Munro, W. J., Beausoleil, R. G.

SPIE - The International Society of Optical Engineering

Ralph, T.C., Munro, W.J., Milburn, G.J.

SPIE-The International Society for Optical Engineering

Santori, C., Fattal, D., Spillane, S.M, Fiorentino, M., Beausoleil, R. G., Munro, W. J., Spiller, T. P, Greentree, A D., …

SPIE - The International Society of Optical Engineering

Beaysoleil, R. G., Fattal, D., Fiorentino, M., Santori, C., Snider, G., Spillane, S. M., Williams, R. S., Munro, W. J., …

SPIE - The International Society of Optical Engineering

Hughes, R. J., Chapuran, T. E., Dallmann, N., Hiskett, P. A., MacCabe, K. P., Montano, P. M., Nordhalt, J. E., Peterson, …

SPIE - The International Society of Optical Engineering

Kohler, C., de Boeij, W., van Ingen-Schenau, K., van de Kerkhof, M., de Klerk, J., Kok, H., Swinkels, G., Finders, J., …

SPIE - The International Society of Optical Engineering

Nemoto, K., Gilchrist, A., Munro, W.J., Ralph, T.C., Braunstein, S.L., Milburn, G.J.

SPIE-The International Society for Optical Engineering

Liang, C., Lee, K. F., Voss, P.L., Comdorf, E., Kanter, G. S,., Chen, J., Li, X., Kumar, P.

SPIE - The International Society of Optical Engineering

Brida, G., Cogliero, E., Genovese, M., Gramegma, M., Predazzi, E.

SPIE - The International Society of Optical Engineering

Boyd, R. W., Chang, H. J., Shin, H., O’Sullivan-Hale,

SPIE - The International Society of Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12