1.

Conference Proceedings
Conference Proceedings
1. AN INVESTIGATION OF BURIED LAYER FORMATION BY 40keV OXYGEN IMPLANTATION INTO SILICON
Li, Y. ; Kilner, A. ; Chater, R. J. ; Tate, T. J. ; Hemment, P. L. F. ; Nejim, A.
Pub. info.: Phase formation and modification by beam-solid interactions : symposium held December 2-6, 1991, Boston, Massachusetts, U.S.A..  pp.115-120,  1992.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 235
2.

Conference Proceedings
Conference Proceedings
2. Influence of Dynamic Annealing on the Depth Distribution of Germanium Implanted in (100) Silicon at Elevated Temperatures
Nejim, A. ; Jeynes, C. ; Webb, R. P. ; Cowern, N. E. B. ; Patel, C. J.
Pub. info.: Defects and diffusion in silicon processing : symposium held April 1-4, 1997, San Francisco, California, U.S.A..  pp.387-,  1997.  Pittsburg, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 469
3.

Conference Proceedings
Conference Proceedings
3. CONTROL OF AND MECHANISMS FOR ROOM TEMPERATURE VISIBLE LIGHT EMISSION FROM SILICON NANOSTRUCTURES IN SiO2 FORMED BY Si+ ION IMPLANTATION
Komoda, T. ; Kelly, J. P. ; Nejim, A. ; Homewood, K. P. ; Hemment, P. L. F. ; Sealy, B. J.
Pub. info.: Microcrystalline and nanocrystalline semiconductors : Symposium held November 29-December 2, 1994, Boston, Massachusetts, U.S.A..  pp.163-,  1995.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 358
4.

Conference Proceedings
Conference Proceedings
4. Photoluminescence of Extended Defects in Silicon-on-Insulator Formed by Implantation of Oxygen
Qian, Y. H. ; Evans, J. H. ; Giles, L. F. ; Nejim, A. ; Hemment, P. L. F.
Pub. info.: Defect and impurity engineered semiconductors and devices : symposium held April 17-21, 1995, San Francisco, California, U.S.A..  pp.629-,  1995.  Pittsburgh, PA.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 378
5.

Conference Proceedings
Conference Proceedings
5. Defect Tails in Ge Implanted Si Probed by Slow Positrons and Ion Channeling
Knights, A. P. ; Nejim, A. ; Barradas, N. P. ; Gwilliam, R. ; Coleman, P. G. ; Malik, F. ; Kherandish, H. ; Romani, S.
Pub. info.: Silicon front-end technology--materials processing and modelling, symposium held April 13-15, 1998, San Francisco, California, U.S.A..  pp.79-,  1998.  Warrendale, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 532
6.

Conference Proceedings
Conference Proceedings
6. Structural characterization by RBS and TEM of SiC buried layers formed by ion beam synthesis at high temperature
Nejim, A. ; Hemment, P.L.F. ; Stoemenos, J.
Pub. info.: Proceedings of the Sixth International Symposium on Silicon-on-Insulator Technology and Devices.  pp.167-172,  1994.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 1994-11
7.

Conference Proceedings
Conference Proceedings
7. Nucleation of oxidation induced stacking faults (01SF) in ion implanted SIMOX structures
Giles, L.F. ; Nejim, A. ; Cristiano, F. ; Hemment, P.L.F.
Pub. info.: Proceedings of the Sixth International Symposium on Silicon-on-Insulator Technology and Devices.  pp.98-103,  1994.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 1994-11
8.

Conference Proceedings
Conference Proceedings
8. Delineation of crystallographic defects in ultra thin SIMOX materials produced by low energy low dose oxygen implantation
Giles, L.F. ; Meyyappan, N. ; Nejim, A. ; Blake, J. ; Cristiano, F. ; Hemment, P.L.F.
Pub. info.: Proceedings of the Sixth International Symposium on Silicon-on-Insulator Technology and Devices.  pp.50-56,  1994.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 1994-11