1.

Conference Proceedings
Conference Proceedings
1. Intensity oscillations in reflection high energy electron diffraction during epitaxial growth
Dobson J. P. ; Joyce A. B. ; Neave H. J. ; Zhang J.
Pub. info.: Surface and interface characterization by electron optical methods.  pp.185-193,  1988.  New York.  Plenum Press
Title of ser.: NATO ASI series. Series B, Physics
Ser. no.: 191
2.

Conference Proceedings
Conference Proceedings
2. RHEED Intensity Oscillations During MBE Growth of ?-? Compounds-An Overview
Joyce A. B. ; Neave H. J. ; Zhang J. ; Dobson J. P.
Pub. info.: Reflection high-energy electron diffraction and reflection electron imaging of surfaces.  pp.397-417,  1988.  New York.  Plenum Press
Title of ser.: NATO ASI series. Series B, Physics
Ser. no.: 188
3.

Conference Proceedings
Conference Proceedings
3. Dynamic RHEED Techniques and Interface Quality in MBE-Grown GaAs/(Al, Ga) As structures
Joyce A. B. ; Neave H. J. ; Zhang J. ; Dobson J. P. ; Dawson P. ; Moore J. K. ; Foxon T. C.
Pub. info.: Thin film growth techniques for low-dimensional structures.  pp.19-35,  1987.  New York.  Plenum Press
Title of ser.: NATO ASI series. Series B, Physics
Ser. no.: 163