1.

Conference Proceedings

Conference Proceedings
Neal, D.R. ; Copland, J. ; Neal, D.A.
Pub. info.: Advanced characterization techniques for optical, semiconductor, and data storage components : 9-11 July 2002 Seattle, Washington, USA.  pp.148-160,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4779
2.

Conference Proceedings

Conference Proceedings
Rammage, R.R. ; Neal, D.R. ; Copland, R.J.
Pub. info.: Advanced characterization techniques for optical, semiconductor, and data storage components : 9-11 July 2002 Seattle, Washington, USA.  pp.161-172,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4779
3.

Conference Proceedings

Conference Proceedings
Neal, D.R. ; Pulaski, P. ; Raymond, T.D. ; Neal, D.A. ; Wang, Q. ; Griesmann, U.
Pub. info.: Advanced wavefront control : methods, devices, and applications : 6-7 August 2003, San Diego, California, USA.  pp.129-138,  2003.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5162
4.

Conference Proceedings

Conference Proceedings
Pulaski, P.D. ; Roller, J.P. ; Neal, D.R. ; Ratte, K.
Pub. info.: Current developments in lens design and optical engineering III : 8-9 July 2002, Seattle, USA.  pp.44-52,  2002.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4767
5.

Conference Proceedings

Conference Proceedings
Raymond, T.D. ; Neal, D.R. ; Topa, D.M. ; Schmitz, T.L.
Pub. info.: Nanoscale Optics and Applications.  pp.208-216,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4809
6.

Technical Paper

Technical Paper
Neal, D.R. ; Hedlund, E. ; Lederer, M. ; Collier, A. ; Spring, C. ; Yanta, W.
Pub. info.: AIAA paper.  pp.1-13,  1998.  American Institute of Aeronautics and Astronautics
Title of ser.: AIAA Paper : AIAA Advanced Measurement and Ground Testing Technology Conference
Ser. no.: 1998