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11 results

Conference Proceedings

1. Charge Trapping in High-Dose Ge-Implanted and Si- Implanted Silicon-Dioxide Thin Films

Nazarov, A.N. ; Osiyuk, I.N. ; Tyagulskii, I.P. ; Lysenko, V.S. ; Gebel, T. ; Skorupa, W.

Pub. info.:	Silicon nitride and silicon dioxide thin insulating films VII : proceedings of the international symposium. pp.144-152, 2003. Pennington, N.J.. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	2003-2

Conference Proceedings

2. High-temperature behavior of fully-depleted SOI MOSFETs in case of charge instability of buried oxide

Nazarov, A.N. ; Houk, Y. ; Vovk, Ya.N. ; Lysenko, V.S. ; Flandre, D.

Pub. info.:	Silicon-on-insulator technology and devices XII : proceedings of the international symposium. pp.113-118, 2005. Pennington, N.J.. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	2005-03

Conference Proceedings

3. Comparative Study of Near Stochiometric a-SiC:H and a-SiC Films: Effect of the Bonded Hydrogen

Vasin, A.V. ; Rusavsky, A.V. ; Kushnirenko, V.I. ; Starik, S.P. ; Kutsay, O.M. ; Nazarov, A.N. ; Lysenko, V.S. ; Semenov, A.V. ; Puzikov, V.M. ; Gontar, A.G. ; Dub, S.N.

Pub. info.:	Innovative superhard materials and sustainable coatings for advanced manufacturing. pp.419-428, 2005. Dordrecht. Springer
Title of ser.:	NATO science series. Series 2, Mathematics, physics and chemistry
Ser. no.:	200

Conference Proceedings

4. Rare Earth Ion Implantation for Silicon Based Light Emission: From Infrared to Ultraviolet

Skorupa, W. ; Sun, J.M. ; Prucnal, S. ; Rebohle, L. ; Gebel, T. ; Nazarov, A.N. ; Osiyuk, I.N. ; Dekorsy, T. ; Helm, M.

Pub. info.:	Rare-earth doping for optoelectronic applications : symposium held March 29-31, 2005, San Francisco, California, U.S.A.. pp.105-116, 2005. Warrendale, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	866

Conference Proceedings

5. Charge carrier injection and trapping in the buried oxides of SOI structures

Nazarov, A.N. ; Kilchytska, V. ; Barchuk, I.P.

Pub. info.:	Progress in SOI structures and devices operating at extreme conditions. pp.139-158, 2002. Dordrecht. Kluwer Academic Publishers
Title of ser.:	NATO science series. Series 2, Mathematics, physics and chemistry
Ser. no.:	58

Conference Proceedings

6. C-V and thermally activated investigation of ZMR SOI meza structures

Nazarov, A.N. ; Lysenko, V.S. ; Gusev, V.A. ; Kilchitskaya, V.I.

Pub. info.:	Proceedings of the Sixth International Symposium on Silicon-on-Insulator Technology and Devices. pp.236-244, 1994. Pennington, NJ. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	1994-11

Conference Proceedings

7. Nature of high-temperature charge instability of fully depleted SOI MOSFETs

Nazarov, A.N. ; Lysenko, V.S. ; Colinge, J.P. ; Flandre, D.

Pub. info.:	Silicon-on-insulator technology and devices XI : proceedings of the international symposium. pp.455-460, 2003. Pennington, N.J.. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	2003-5

Conference Proceedings

8. Properties of SOI MOSFET's obtained on multilayer buried dielectrics

Lysenko, V.S. ; Nazarov, A.N. ; Rudenko, T.E. ; Rudenko, A.N. ; Kilchitskaya, V.I. ; Givargizov, E.I. ; Limanov, A.B.

Pub. info.:	Proceedings of the Sixth International Symposium on Silicon-on-Insulator Technology and Devices. pp.324-332, 1994. Pennington, NJ. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	1994-11

Conference Proceedings

9. Hydrogen and high-temperature charge instability of SOI structures and MOSFETs

Nazarov, A.N.

Pub. info.:	Science and technology of semiconductor-on-insulator structures and devices operating in a harsh environment. pp.121-132, 2005. Dordrecht. Kluwer Academic Publishers
Title of ser.:	NATO science series. Series 2, Mathematics, physics and chemistry
Ser. no.:	185

10.

Conference Proceedings

10. Ion Beam Processing for Silicon-Based Light Emission

Skorupa, W. ; Dekorsy, T. ; Gebel, T. ; Helm, M. ; Lysenko, V.S. ; Nazarov, A.N. ; Osiyuk, I.N. ; Rebohle, L. ; Schmidt, B. ; Sun, J.M.

Pub. info.:	Radiation effects and ion-beam processing of materials : symposium held December 1-5, 2003, Boston, Massachusetts, U.S.A.. pp.357-370, 2004. Warrendale, PA. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	792

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Author: Nazarov, A.N.