1.

Conference Proceedings
Conference Proceedings
1. Bonded Silicon Silicide on Insulator (S2OI) a Study of Chemical, Physical and Optical Properties for Advanced Device Fabrication
Nayar, V. ; Carline, R.T. ; Newey, J. ; Pidduck, A.J. ; Reeves, C. ; Russell, J. ; Williams, G. ; Quinn, C. ; Nevin, A. ; Blackstone, S. ; Feindt, S.
Pub. info.: Proceedings of the Fourth International Symposium on Semiconductor Wafer Bonding : science, technology, and applications.  pp.544-551,  1997.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 97-36
2.

Conference Proceedings
Conference Proceedings
2. Control And Impact Of Atmospheric Impurity Infiltration On Thin Thermal Gate Oxides
Nayar, V. ; Uren, M.J. ; Brunson, K.M. ; Filleul, M.L. ; Jackson, R. ; Hodge, A.M.
Pub. info.: Proceedings of the third Symposium on Silicon Nitride and Silicon Dioxide Thin Insulating Films.  pp.305-314,  1994.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 1994-16
3.

Conference Proceedings
Conference Proceedings
3. Complexity of Electronic Behaviour at the Si:SiO2 Interface
Uren, M.J. ; Nayar, V. ; Brunson, K.M. ; Anthony, C.J.
Pub. info.: Proceedings of the Symposium on Silicon Nitride and Silicon Dioxide Thin Insulating Films.  pp.57-71,  1997.  Pennington, New Jersey.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 97-10
4.

Conference Proceedings
Conference Proceedings
4. CMOS Compatible Silicon Micromachining Using TMAH
Bozeat, R.J. ; Bunyan, R.J.T. ; Nayar, V.
Pub. info.: Proceedings of the Second International Symposium on Microstructures and Microfabricated Systems.  pp.272-279,  1995.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 95-27
5.

Conference Proceedings
Conference Proceedings
5. Fast and Slow States after Negative-Bias Stress on N2O Oxynitrides
Nayar, V. ; Uren, M.J. ; Ostler, J.M.
Pub. info.: The physics and chemistry of SiO[2] and the Si-SiO[2] interface-3, 1996 : proceedings of the Third International Symposium on the Physics and Chemistry of SiO[2] and the Si-SiO[2] Interface.  pp.657-666,  1996.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 96-1
6.

Conference Proceedings
Conference Proceedings
6. Microstructure of Bonded SOI Films
Nayar, V. ; Keir, A.M.
Pub. info.: Proceedings of the Third International Symposium on Semiconductor Wafer Bonding : physics and applications.  pp.279-289,  1995.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 95-7