1.

Conference Proceedings
Conference Proceedings
1. High-temperature single-hole silicon transistors
Bagraev,N.T. ; Gehlhoff,W. ; Klyachkin,L.E. ; Malyarenko,A.M. ; Naser,A. ; Romanov,V.V.
Pub. info.: International Workshop on New Approaches to High-Tech Materials, Nondestructive Testing and Computer Simulations in Materials Science and Engineering : 9-13 June 1997, St. Petersburg, Russia.  pp.166-174,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3345
2.

Conference Proceedings
Conference Proceedings
2. Cadmium-related defects in silicon:electron-paramagnetic resonance identification
Gehlhoff,W. ; Naser,A. ; Lang,M. ; Pensl,G.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part1  pp.423-428,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
3.

Conference Proceedings
Conference Proceedings
3. Spin-dependent processes in self-assembly impurity quantum wires
Bagraev,N.T. ; Gelhoff,W. ; Klyachkin,L.E. ; Malyarenko,A.M. ; Naser,A.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part3  pp.1683-1688,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263