Search records | 東京工業大学附属図書館文献データベース

You can search for articles included in proceedings of international conferences and technical papers which Tokyo Tech Library holds.
Tokyo Tech members can obtain tables of contents of 17,000 foreign journals by SwetScan. Tokyo Tech Library does not cover all of them.
List of Searchable Databases

Clear Form

Search for other sites by same keyword(s).

CiNii Books

NDL Search

WebcatPlus

amazon

カーリル

WorldCat

Filter

Title:

Author:

ISBN / ISSN / Paper No:

Source Title:

Publisher:

Publication Year:

～

Clear Form

Type:

Conference Proceedings

Technical Paper

Academic Journal

Select: Check all | Remove all

Sort order

10 | 50 | 100 / Per Page

28 results

Conference Proceedings

1. Average atmosphere temperature measurement by a frequency-shifted feedback laser

Kibayashi,N. ; Hara,T. ; Yoshida,M. ; Nakamura,K. ; Ito,H.

Pub. info.:	Optical remote sensing of the atmosphere and clouds II : 9-12 October 2000, Sendai, Japan. pp.322-329, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4150

Conference Proceedings

2. Performance of the future spaceborne dual-wavelength radar for rain and snow observation

Adhikari,N.B. ; Nakamura,K.

Pub. info.:	Microwave remote sensing of the atmosphere and environment II : 9-12 October 2000, Sendai, Japan. pp.1-12, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4152

Conference Proceedings

3. Polarimetric SAR observation of sea ice in the Sea of Okhotsk

Wakabayashi,H. ; Shimada,M. ; Matsuoka,T. ; Nakamura,K. ; Nishio,F.

Pub. info.:	Microwave remote sensing of the atmosphere and environment II : 9-12 October 2000, Sendai, Japan. pp.339-346, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4152

Conference Proceedings

4. "Tropical precipitation studies using VHF/L-band wind profilers and disdrometer over Gadanki, India"

Reddy,K.K. ; Nakamura,K. ; Kozu,T. ; Jain,A.R. ; Rao,D.N.

Pub. info.:	Microwave remote sensing of the atmosphere and environment II : 9-12 October 2000, Sendai, Japan. pp.62-72, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4152

Conference Proceedings

5. Characteristics of the mirror image of precipitation observed by TRMM precipitation radar

Li,J. ; Nakamura,K.

Pub. info.:	Microwave remote sensing of the atmosphere and environment II : 9-12 October 2000, Sendai, Japan. pp.141-151, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4152

Conference Proceedings

6. Coaxially excited gas lasers:toward the vacuum ultraviolet region

El-Oseary,M.A. ; Jitsuno,T. ; Nakatsuka,M. ; Ohoguchi,Y. ; Ido,T. ; Nakamura,K. ; Horiguchi,S.

Pub. info.:	Advanced high-power lasers : 1-5 November 1999, Osaka, Japan. pp.774-779, 2000. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3889

Conference Proceedings

7. Mid-infrared camera and spectrometer(MICS)and sky noise measurement in the N-band

Miyata,T. ; Kataza,H. ; Okamoto,Y. ; Onaka,T. ; Yamashita,T. ; Nakamura,K.

Pub. info.:	Optical and IR telescope instrumentation and detectors : 27-31 March 2000, Munich, Germany. Part2 pp.842-852, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4008

Conference Proceedings

8. Control system for the Subaru Telescope

Tanaka,W. ; Sasaki,T. ; Noguchi,T. ; Okita,K. ; Nakamura,K. ; Ito,F. ; Katsuki,Y. ; Ishihara,S.

Pub. info.:	Telescope control systems III : 20-21 March 1998, Kona, Hawaii. pp.478-482, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3351

Conference Proceedings

9. Effects of metal impuritites on the etch rate selectivity of(110)/(111)in(11O)Si anisotropic etching

Hirata,Y. ; Tsugai,M. ; Tanimoto,K. ; Usami,T. ; Yamaguchi,Y. ; Otani,H. ; Nakamura,K.

Pub. info.:	Micromachining and microfabrication process technology V : 20-22 September, 1999, Santa Clara, California. pp.276-283, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3874

10.

Conference Proceedings

10. Effect of Shape of Crystal-Melt Interface on Point Defect Reaction in Silicon Crystals

Nakamura,K. ; Maeda,S. ; Togawa,S. ; Saishoji,T. ; Tomioka,J.

Pub. info.:	High Purity Silicon VI : proceedings of the sixth International Symposium. pp.31-43, 2000. Pennington, N.J., Bellingham, Wash.. Electrochemical Society — SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4218

28 results

Select: Check all | Remove all

Sort order

10 | 50 | 100 / Per Page

Filtering by:

Author: Nakamura,K.