1.

Conference Proceedings

Conference Proceedings
Usami, A. ; Fujiwara, H. ; Nakai, T. ; Matsuki, K. ; Takeuchi, T. ; Wada, T.
Pub. info.: Chemical surface preparation, passivation, and cleaning for semiconductor growth and processing : symposium held April 27-29, 1992, San Francisco, California, U.S.A..  pp.261-268,  1992.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 259
2.

Conference Proceedings

Conference Proceedings
Kubozono, Y. ; Takabayashi, Y. ; Hiraoka, K. ; Nakai, T. ; Ohta, T. ; Maeda, H. ; Kashino, S.
Pub. info.: Proceedings of the Symposium on Recent Advances in the Chemistry and Physics of Fullerenes and Related Materials.  pp.390-400,  1997.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 97-14
3.

Conference Proceedings

Conference Proceedings
Sudou, M. ; Kainuma, M. ; Nakai, T. ; Tomizawa, K.
Pub. info.: Proceedings of the Eighth International Symposium on Silicon-on-Insulator Technology and Devices.  pp.119-124,  1997.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 97-23
4.

Conference Proceedings

Conference Proceedings
Kondo, K. ; Genji, T. ; Nakai, T. ; Imamura, K. ; Imada, Y.
Pub. info.: OFS-13 : 13th International Conference on Optical Fiber Sensors & Workshop on Device and System Technology toward Future Optical Fiber Communication and Sensing : April 12-16, 1999, Kyongju Hyundai Hotel, Kyongju, Korea.  pp.208-211,  1999.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3746
5.

Conference Proceedings

Conference Proceedings
Nakai, T. ; Ashida, S. ; Todori, K. ; Yusu, K. ; Ichihara, K. ; Tatsuta, S. ; Taketoshi, N. ; Baba, T.
Pub. info.: Optical data storage 2004 : 18-21 April 2004, Monterey, California, USA.  pp.464-473,  2004.  Bellingham.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5380
6.

Conference Proceedings

Conference Proceedings
Nakai, T. ; Yoshiki, M. ; Ohmachi, N.
Pub. info.: Optical Data Storage 2006 : 23-26 April 2006, Montreal, Canada.  pp.62822E-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6282
7.

Conference Proceedings

Conference Proceedings
Usami, A. ; Nakai, T. ; Fujiwara, H. ; Ishigami, S. ; Wada, T. ; Matsuki, K ; Takeuchi, T.
Pub. info.: Defect engineering in semiconductor growth, processing and device technology : symposium held April 26-May 1, 1992, San Francisco, California, U.S.A..  pp.295-300,  1992.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 262
8.

Conference Proceedings

Conference Proceedings
Tsukamoto, T. ; Nakai, T. ; Ashida, S. ; Yusu, K. ; Ichihara, K. ; Ohmachi, N. ; Morishita, N. ; Yoshida, N. ; Nakamura, N.
Pub. info.: Optical data storage 2003 : 11-14 May 2003, Vancouver, British Columbia, Canada.  pp.118-123,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5069
9.

Conference Proceedings

Conference Proceedings
Usami, A. ; Nakai, T. ; Ishigami, S. ; Wada, T. ; Matsuki, K. ; Takeuchi, T.
Pub. info.: Semiconductors for room-temperature radiation detector applications : symposium held April 12-16, 1993, San Francisco, California, U.S.A..  pp.585-,  1993.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 302
10.

Technical Paper

Technical Paper
Nakai, T. ; Ogishi, H.
Pub. info.: 2010 SAE world congress : technical paper.  2010.  Warrendale, Penn..  Society of Automotive Engineers
Title of ser.: Society of Automotive Engineers technical paper series
Ser. no.: 2010