1.

Conference Proceedings
Conference Proceedings
1. High-k Gate Stacks Electrical Characterization at the Nanoscale using Conductive-AFM
Nafria, M. ; Blasco, X. ; Porti, M. ; Aguilera, L. ; Aymerich, X.
Pub. info.: Defects in high-κ gate dielectric stacks : nano-electronic semiconductor devices.  pp.435-447,  2006.  Dordrecht.  Springer
Title of ser.: NATO science series. Series 2, Mathematics, physics and chemistry
Ser. no.: 220
2.

Conference Proceedings
Conference Proceedings
2. Mesoscopic transport in broken down ultrathin SiO2 films
Miranda, E. ; Sune, N. ; Rodriguez, R. ; Nafria, M. ; Aymerich, X.
Pub. info.: Structure and electronic properties of ultrathin dielectric films on silicon and related structures : symposium held November 29-December 1, 1999, Boston, Massachusetts, U.S.A..  pp.93-,  2000.  Warrendale, PA.  MRS-Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 592
3.

Conference Proceedings
Conference Proceedings
3. Evaluation of the degradation dynamics of thin silicon dioxide films using model-independent procedures
Rodriguez, R. ; Nafria, M. ; Miranda, E. ; Sune, J. ; Aymerich, X.
Pub. info.: Structure and electronic properties of ultrathin dielectric films on silicon and related structures : symposium held November 29-December 1, 1999, Boston, Massachusetts, U.S.A..  pp.147-,  2000.  Warrendale, PA.  MRS-Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 592
4.

Conference Proceedings
Conference Proceedings
4. Electrical characterization of atomic-force microscopy grown SiO2
Blasco, X. ; Nafria, M. ; Aymerich, X.
Pub. info.: Nanotechnology.  pp.558-564,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5118
5.

Conference Proceedings
Conference Proceedings
5. Nanometer-scale analysis of current limited stresses impact on SiO2 gate oxide reliability using C-AFM
Porti, M. ; Nafria, M. ; Aymerich, X.
Pub. info.: Nanotechnology.  pp.466-473,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5118
6.

Conference Proceedings
Conference Proceedings
6. Charge storage in Si nanocrystals embedded in SiO2 with enhanced C-AFM
Porti, M. ; Avidano, M. ; Nafria, M. ; Aymerich, X. ; Carreras, J. ; Garrido, B.
Pub. info.: Nanotechnology II.  pp.43-51,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5838
7.

Conference Proceedings
Conference Proceedings
7. Ring oscillator behavior after oxide breakdown
Fernandez, R. ; Rodriguez, R. ; Nafria, M. ; Aymerich, X.
Pub. info.: VLSI Circuits and Systems II.  pp.374-379,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5837