1.

Conference Proceedings
Conference Proceedings
1. Comparison between Direct-Contact HfO2/Ge and HfO2/GeO2/Ge Stack Structures: Physical and Electrical Properties
Y. Abe ; N. Miyata ; T. Yasuda
Pub. info.: Physics and technology of high-k gate dielectrics 6.  pp.375-385,  2008.  Pennington, NJ.  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 16(5)
2.

Conference Proceedings
Conference Proceedings
2. Origins for Electron Mobility Improvement in InGaAs MISFETs with (NH₄)₂₅ Treatment
Y. Urabe ; N. Miyata ; T. Yasuda ; H. Ishii ; T. Itatani ; H. Yamada ; N. Fukuhara ; M. Hata ; M. Yokoyama ; M. Takenaka ; S. Takagi
Pub. info.: Materials and devices for end-of-roadmap and beyond CMOS scaling : symposium held April 5-9, 2010, San Francisco, California.  pp.105-112,  2010.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 1252