1.

Conference Proceedings
Conference Proceedings
1. RAPID THERMAL ANNEALING EFFECTS INxInGa1-xAs/GaAs STRAINED-LAYER SUPERLATTICES
Olsen, J. A. ; Hu, E. L. ; Myers, D. R. ; Klem, J. F. ; Skumanich, Andrew
Pub. info.: Heteroepitaxy of dissimilar materials : symposium held April 29-May 2, 1991, Anaheim, California, U.S.A..  pp.453-458,  1991.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 221
2.

Conference Proceedings
Conference Proceedings
2. CONTROL OF SOLID-EXCITATION-BASED PHOTOCHEMICAL DRY ETCHING OF SEMICONDUCTORS BY ION-BOMBARDMENT-INDUCED DAMAGE
Ashby, C. I. H. ; Myers, D. R.
Pub. info.: Laser and particle-beam chemical processing for microelectronics : symposium held December 1-3, 1987, Boston, Massachusetts, USA.  pp.429-434,  1988.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 101
3.

Conference Proceedings
Conference Proceedings
3. TEMPERATURE DEPENDENCE OF IMPLANTATION DAMAGE IN STRAINED-LAYER SUPERLATTICES
Myers, D. R. ; Arnold, G. W. ; Dawson, L. R., ; Biefeld, r. M. ; Hills, C. R. ; Doyle, B. L.
Pub. info.: Materials modification and growth using Ion beams : symposium held April 21-23, 1987, Anaheim, California, U.S.A..  pp.187-192,  1987.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 93
4.

Conference Proceedings
Conference Proceedings
4. CHARACTERIZATION OF BURIED-NITRIDE SILICON FOR INTEGRATED CIRCUIT APPLICATIONS
Myers, D. R. ; Stein, H., J. ; Tsao, S. S. ; Arnod, G. W. ; Hughes, R. C. ; Miller, W. M. ; Jones, R. V. ; Datye, A. K
Pub. info.: Materials modification and growth using Ion beams : symposium held April 21-23, 1987, Anaheim, California, U.S.A..  pp.113-118,  1987.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 93
5.

Conference Proceedings
Conference Proceedings
5. FORMATION OF BURIED NITRIDE LAYERS IN (110) SILICON
Datye, A. K. ; Kaushik, V. S. ; Kendall, D. L. ; Martinez-Tovar, B. ; Myers, D. R.
Pub. info.: Silicon-on-insulator and buried metals in semiconductors : symposium held November 30-December 3, 1987, Boston, Massachusetts, U.S.A..  pp.461-466,  1988.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 107
6.

Conference Proceedings
Conference Proceedings
6. ION IMPLANTATION DISORDER IN STRAINED-LAYER SUPERLATTICES
Arnold, G. W. ; Picrauz-S. T. ; Peercy, P. S. ; Myers, D. R. ; Biefeild, R. M. ; Dawson, L. R.
Pub. info.: Layered structures, epitaxy, and interfaces : symposium held November 26-30, 1984, Boston, Massachusetts, U.S.A..  pp.307-312,  1985.  Pittsburgh.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 37
7.

Conference Proceedings
Conference Proceedings
7. MEASUREMENTS OF ION-IMPLANTATION DAMAGE IN GaP
Myers, D. R. ; Peercy, P. S. ; Gourley, P.L.
Pub. info.: Defects in semiconductors II : symposium held November 1982 in Boston, Massachusetts, U.S.A..  pp.505-510,  1983.  New York.  North-Holland
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 14
8.

Conference Proceedings
Conference Proceedings
8. AN EVALUATION OF IMPLANTATION-DISORDERING OF (InGa)As/GaAs STRAINED-LAYER SUPERLATTICES
Myers, D. R. ; Barnes, C. E. ; Arnold, G. W. ; Dawson, L. R. ; Biefeild, R. M. ; Zipperian, T. E. ; Gourley, P. L. ; Fritz, I. J.
Pub. info.: Layered structures, epitaxy, and interfaces : symposium held November 26-30, 1984, Boston, Massachusetts, U.S.A..  pp.313-318,  1985.  Pittsburgh.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 37
9.

Conference Proceedings
Conference Proceedings
9. Optical radiation measurements for photovoltaic applications: instrumentation uncertainty and performance
Myers, D. R. ; Redo, I. ; Wilcox, S. ; Andreas, A.
Pub. info.: Organic photovoltaics V : 4-6 August 2004, Denver, Colorado, USA.  pp.142-153,  2004.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5520