1.

Conference Proceedings

Conference Proceedings
Job,R. ; Ulyashin,A.G. ; Fahrner,W.R. ; Markevich,V.P. ; Murin,L.I. ; Lindstrom,J.L. ; Raiko,V. ; Engemann,J.
Pub. info.: High Purity Silicon VI : proceedings of the sixth International Symposium.  pp.209-220,  2000.  Pennington, N.J., Bellingham, Wash..  Electrochemical Society — SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4218
2.

Conference Proceedings

Conference Proceedings
Markevich,V.P. ; Murin,L.I. ; Sekiguchi,T. ; Suezawa,M.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part1  pp.217-222,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
3.

Conference Proceedings

Conference Proceedings
Hallberg,T. ; Lindstrom,J.L. ; Murin,L.I. ; Markevich,V.P.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part1  pp.361-366,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
4.

Conference Proceedings

Conference Proceedings
Lindstrom,J.L. ; Hallberg,T. ; Aberg,D. ; Svensson,B.G. ; Murin,L.I. ; Markevich,V.P.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part1  pp.367-372,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
5.

Conference Proceedings

Conference Proceedings
Murin,L.I. ; Markevich,V.P.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.1315-1320,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201
6.

Conference Proceedings

Conference Proceedings
Markevich,V.P. ; Medvedeva,I.F. ; Murin,L.I. ; Sekiguchi,T. ; Suezawa,M. ; Sumino,K.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.945-950,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201