1.

Conference Proceedings
Conference Proceedings
1. Tailoring Multi-Component Thin Films by Pulse Plasma Method
Itatani, R. ; Yasaka, Y. ; Murayama, K. ; Hatta, A.
Pub. info.: Proceedings of the second International Symposium on Electrochemical Processing of Tailored Materials.  pp.201-215,  1993.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 1993-12
2.

Conference Proceedings
Conference Proceedings
2. Surface Modification of Magnesium Alloys by Laser Alloying Using Si Powder
Murayama, K. ; Suzuki, A. ; Takagi, T. ; Kamado, S. ; Kojima, Y. ; Hiraga, H.
Pub. info.: Magnesium alloys 2003 : proceedings of the Second Osaka International Conference on Platform Science and Technology for Advanced Magnesium Alloys 2003, Osaka, Japan, 26-30, January, 2003.  pp.969-974,  2003.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 419-422
3.

Conference Proceedings
Conference Proceedings
3. Band Gap of Luminescent Porous Silicon
Murayama, K. ; Komatsu, H. ; Miyazaki, S. ; Hirose, M.
Pub. info.: Proceedings of the International Symposium on Advanced Luminescent Materials.  pp.200-211,  1995.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 95-25
4.

Technical Paper
Technical Paper
4. Development of residual life evaluation system for boiler materials
Murayama, K. ; Murataya, T. ; Koshimizu, T. ; Yokoyama, T. ; Masuyama, F. ; Nishimura, N.
Pub. info.: A.S.M.E. paper.  1991.  New York, NY.  The American Society of Mechanical Engineers
Title of ser.: ASME Technical Paper : JPGC/Pwr
Ser. no.: 1991
5.

Technical Paper
Technical Paper
5. Study of Oil Flow Surrounding Piston Rings and Visualization Observation.
Usui, M. ; Murayama, K. ; Oogake, K. ; Yoshida, H.
Pub. info.: 2008 SAE world congress : technical paper.  2008.  Warrendale, Penn..  Society of Automotive Engineers
Title of ser.: Society of Automotive Engineers technical paper series
Ser. no.: 2008
6.

Conference Proceedings
Conference Proceedings
6. Three-dimensional metrology with side-wall measurement using tilt-scanning operation in digital probing AFM [6152-42]
Murayama, K. ; Gonda, S. ; Koyangai, H. ; Terasawa, T.
Pub. info.: Metrology, Inspection, and Process Control for Microlithography XX.  pp.615216-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6152