Muegge, B., Massoth, F. E.
Elsevier
|
Thilo Reichel, Jochem Beissel, Vitaliy Pavlyk, Gernot Heigl
American Society of Mechanical Engineers
|
Landau, M. V., Kogan, L. O., Herskowitz, M.
Elsevier
|
Marquis, M. C., Armstrong, R. L., Ashcroft, P., Brodzik, M. J., Conway, D., Khalsa, S. J. S., Lobl, E., Maslanik, J., …
SPIE-The International Society for Optical Engineering
|
Price, Brian C.
American Institute of Chemical Engineers
|
Harms, Weldon M.
American Chemical Society
|
Chatard,J.-P., Tribolet,P.M.
SPIE-The International Society for Optical Engineering
|
Greg J. Thoma, Lyda Zambrano, Chun Yen Wong, Kerry L. Sublette, Kathleen Duncan
American Institute of Chemical Engineers
|
Agee,F.J., Lehr,J.M., Prather,W.D., Scholfield,D.W.
SPIE-The International Society for Optical Engineering
|
Sohn L. L., Black T. C., Eriksson M., Crommie M., Hess H.
Kluwer Academic Publishers
|
Tasker, M.L.
Kluwer Academic Publishers
|
Webb,J.D., Loos,K.R., yao,C.L., Krueger,D.C., Reid,S.A., Williamson,S., Delong,M.J., Chipman,P.I.
Air & Waste Management Association
|