1.

Conference Proceedings

Conference Proceedings
Ishimori, Y. ; Kawano, K. ; Shinozaki, T. ; Mouri, M. ; Kase, T. ; Tamiya, E. ; Ishizuka, M.
Pub. info.: Advanced environmental sensing technology II : 31 October-1 November, 2001, Newton, [Massachusetts] USA.  pp.40-48,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4576
2.

Conference Proceedings

Conference Proceedings
Mouri, M. ; Ishimori, Y. ; Kawano, K. ; Uchida, H. ; Ishikawa, Y. ; Tamiya, E. ; Ishizuka, M.
Pub. info.: Environmental monitoring and remediation III : 28-30 October 2003, Providence, Rhode Island, USA.  pp.78-85,  2004.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5270
3.

Conference Proceedings

Conference Proceedings
Murahshi, M. ; Ishimori, Y. ; Kawano, K. ; Kasa, T. ; Mouri, M. ; Morita, Y. ; Murakami, Y. ; Yokoyama, K. ; Tamiya, E.
Pub. info.: Advanced environmental sensing technology II : 31 October-1 November, 2001, Newton, [Massachusetts] USA.  pp.255-262,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4576
4.

Technical Paper

Technical Paper
Otsuka, S. ; Owaki, M. ; Suzuki, Y. ; Honda, H. ; Nakashima, K. ; Mouri, M. ; Sato, N.
Pub. info.: 2000 SAE world congress : technical paper.  pp.1-6,  2000.  Warrendale, Penn..  Society of Automotive Engineers
Title of ser.: Society of Automotive Engineers technical paper series
Ser. no.: 2000