Tohiji, K. ; Paul, A. ; Moro, L. ; Malhotra, R. ; Lorenes, D. ; Ruoff, R.
Pub. info.:
Proceedings of the symposium on recent advances in the chemistry and physics of fullerenes and related materials. pp.51-65, 1995. Pennington, NJ. Electrochemical Society
Laser Florence 2002 : a window on the laser medicine world : 28-31 October 2002, Florence, Italy. pp.130-142, 2003. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Moro, L. ; Paul, A. ; Lorents, D. C. ; Malhotra, R. ; Wu, K. J. ; Subramoney, S.
Pub. info.:
Materials modification and synthesis by ion beam processing : symposium held December 2-5, 1996, Boston, Massachusetts, U.S.A.. pp.259-, 1997. Pittsburgh, Pa.. MRS - Materials Research Society
Polignano, M. L. ; Brambilla, M. ; Cazzaniga, F. ; Pavia, G. ; Zanderigo, F. ; Spiga, S. ; Moro, L. ; Castaldini, A. ; Cavallini, A.
Pub. info.:
Defect and impurity engineered semiconductors, II : symposium held April 13-17, 1998, San Francisco, California, U.S.A.. pp.569-, 1998. Warrendale, Pa. MRS - Materials Research Society
Meinardi, F. ; Quilici, S. ; Moro, L. ; Queirolo, G. ; Sabbadini, A.
Pub. info.:
Advanced interconnects and contact materials and processes for future integrated circuits : symposium held April 13-16, 1998, San Francisco, California, U.S.A.. pp.387-, 1998. Warrendale, Pa.. MRS - Materials Research Society
Caputo, D. ; Bacciaglia, P. ; Carpanese, C. ; Polignano, M.L. ; Lazzeri, P. ; Bersani, M. ; Vanzetti, L. ; Pianetta, P. ; Moro, L.
Pub. info.:
Analytical and diagnostic techniques for semiconductor materials, devices, and processes : joint proceedings of the symposia on: ALTECH 2003, Analytical Techniques for Semiconductor Materials and Process Characterization IV, Paris, France and the 202nd Meeting of the Electrochemical Society, Diagnostic Techniques for Semiconductor Materials and Devices VI, Salt Lake City, Utah. pp.493-504, 2003. Pennington, NJ. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Caputo, D. ; Bacciaglia, P. ; Carpanese, C. ; Polignano, M.L. ; Lazzeri, P. ; Bersani, M ; Vanzetti, L. ; Pianetta, P. ; Moro, L.
Pub. info.:
Analytical and diagnostic techniques for semiconductor materials, devices, and processes : joint proceedings of the symposia on: ALTECH 2003, Analytical Techniques for Semiconductor Materials and Process Characterization IV, Paris, France and the 202nd Meeting of the Electrochemical Society, Diagnostic Techniques for Semiconductor Materials and Devices VI, Salt Lake City, Utah. pp.493-504, 2003. Pennington, NJ. Electrochemical Society
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