Search records | 東京工業大学附属図書館文献データベース

You can search for articles included in proceedings of international conferences and technical papers which Tokyo Tech Library holds.
Tokyo Tech members can obtain tables of contents of 17,000 foreign journals by SwetScan. Tokyo Tech Library does not cover all of them.
List of Searchable Databases

Search for other sites by same keyword(s).

CiNii Books

NDL Search

WebcatPlus

amazon

カーリル

WorldCat

Clear Form

Filter

Title:

Author:

ISBN / ISSN / Paper No:

Source Title:

Publisher:

Pub. Date:

～

Type:

Conference Proceedings

Technical Paper

Academic Journal

Clear Form

Select: Check all | Remove all

Sort order

10 | 50 | 100 / Per Page

25 results

Conference Proceedings

1. Silicon-on-insulator based quasi 3D photonic crystal structures

Zelsmann, M. ; Picard, E. ; Calvo, V. ; Charvolin, T. ; Hadji, E. ; Moriceau, H. ; Heitzmann, M. ; Nier, M.E. ; Seassal, C. ; Letartre, X.

Pub. info.:	Photonic crystal materials and devices III : 24-27 January, 2005, San Jose, California, USA. pp.23-31, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	5733

Conference Proceedings

2. Smart Cut Technology: the path for advanced SOI substrates

Moriceau, H. ; Lagahe-Blanchard, C. ; Fournel, F. ; Pocas, S. ; Jalaguier, E. ; Perreau, P. ; Deguet, C. ; Ernst, T. ; Beaumont, A. ; Kernevez, N. ; Hartman, J.M. ; Ghyselen, B. ; Aulnette, C. ; Letertre, F. ; Rayssac, O. ; Faure, B. ; Richtarch, C. ; Cayrefourq, I.

Pub. info.:	Science and technology of semiconductor-on-insulator structures and devices operating in a harsh environment. pp.39-52, 2005. Dordrecht. Kluwer Academic Publishers
Title of ser.:	NATO science series. Series 2, Mathematics, physics and chemistry
Ser. no.:	185

Conference Proceedings

3. Single-Crystal Semiconductor Layer Delamination and Transfer Through Hydrogen Implantation

Bruel, M. ; Aspar, B. ; Moriceau, H. ; Jalaguier, E. ; Lagahe, C.

Pub. info.:	Proceedings of the Third International Symposium on Defects in Silicon. pp.203-214, 1999. Pennington, NJ. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	99-1

Conference Proceedings

4. Influence of the annealing duration on the interface roughness and electrical properties of low-dose SIMOX wafers

Munteanu, D. ; Guilhalmenc, C. ; Cristoloveanu, S. ; Moriceau, H. ; Cartier, A.M. ; Aspar, B.

Pub. info.:	Proceedings of the Eighth International Symposium on Silicon-on-Insulator Technology and Devices. pp.131-136, 1997. Pennington, NJ. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	97-23

Conference Proceedings

5. Unibond SOI Wafers Achieved by Smart-Cut Process

Bruel, M. ; Aspar, B. ; Maleville, C. ; Moriceau, H. ; Auberton-Herve, A.J. ; Barge, T.

Pub. info.:	Proceedings of the Fourth International Symposium on Semiconductor Wafer Bonding : science, technology, and applications. pp.13-24, 1997. Pennington, NJ. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	97-36

Conference Proceedings

6. Detailed Characterization of Wafer Bonding Mechanisms

Maleville, C. ; Rayssac, O. ; Moriceau, H. ; Blasse, B. ; Baroux, L. ; Aspar, B. ; Bruel, M.

Pub. info.:	Proceedings of the Fourth International Symposium on Semiconductor Wafer Bonding : science, technology, and applications. pp.46-55, 1997. Pennington, NJ. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	97-36

Conference Proceedings

7. Unibond SOI wafers achieved by Smart-Cut process

Bruel, M. ; Aspar, B. ; Maleville, C. ; Moriceau, H. ; Auberton-Herve, A.J. ; Barge, T.

Pub. info.:	Proceedings of the Eighth International Symposium on Silicon-on-Insulator Technology and Devices. pp.3-14, 1997. Pennington, NJ. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	97-23

Conference Proceedings

8. Silicon-on-insulator photonic bandgap structures for future microphotonic devices

Hadji, E. ; Cluzel, B. ; Sotta, D. ; Zelsmann, M. ; Picard, E. ; Calvo, V. ; Charvolin, T. ; Heitzmann, M. ; Moriceau, H. ; Seassal, C. ; Letartre, X. ; Ferrand, P.

Pub. info.:	Photonic Crystal Materials and Nanostructures. pp.292-299, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	5450

Conference Proceedings

9. Effect of silicon nitride and silicon dioxide bonding on the residual stress in layer-transferred SOI

Tiberj, A. ; Caniassel, I. ; Planes, N. ; Stoemenos, Y. ; Moriceau, H. ; Rayssac, O.

Pub. info.:	Silicon-on-insulator technology and devices XI : proceedings of the international symposium. pp.117-122, 2003. Pennington, N.J.. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	2003-5

10.

Conference Proceedings

10. INVITED: SILICON ON INSULATOR WAFERS USING THE SMART CUT TECHNOLOGY

Auberton-Herve, A.J. ; Barge, T. ; Metral, F. ; Bruel, M. ; Aspar, B. ; Moriceau, H.

Pub. info.:	Silicon materials science and technology : proceedings of the Eighth International Symposium on Silicon Materials Science and Technology. pp.1341-1360, 1998. Pennington, NJ. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	98-1(2)

25 results

Select: Check all | Remove all

Sort order

10 | 50 | 100 / Per Page

Filtering by:

Author: Moriceau, H.