1.

Conference Proceedings
Conference Proceedings
1. Detection of metal fatigue by laser-instituted thermal vibration
Mori,A. ; Iwasa,S. ; Suzuki,K.
Pub. info.: Engineering thin films with ion beams, nanoscale diagnostics, and molecular manufacturing : 30-31 July 2001, San Diego, USA.  pp.171-178,  2001.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4468
2.

Conference Proceedings
Conference Proceedings
2. Nucleation of Void Defects in Cz Silicon
Yamanaka,Y. ; Tanahashi,K. ; Mikayama,T. ; Inoue,N. ; Mori,A.
Pub. info.: High Purity Silicon VI : proceedings of the sixth International Symposium.  pp.77-85,  2000.  Pennington, N.J., Bellingham, Wash..  Electrochemical Society — SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4218
3.

Conference Proceedings
Conference Proceedings
3. Infrared instrumentation for the Subaru Telescope
Nishimura,T. ; Hayashi,S. ; Kaifu,N. ; Kobayashi,N. ; Kobayashi,Y. ; Tamura,M. ; Takami,H. ; Takata,T. ; Yamashita,T. ; Kataza,H. ; tanabe,T. ; Ito,Y. ; Miyata,T. ; Mori,A. ; Tomono,D. ; Murakawa,K. ; Shibai,H. ; Nagata,T. ; Iwamuro,F.
Pub. info.: Optical telescopes of today and tomorrow : following in the direction of Tycho Brahe : 29 May-2 June, 1996, Landskrona/Hven, Sweden.  pp.1064-1069,  1997.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2871
4.

Conference Proceedings
Conference Proceedings
4. Micropeak array in the scribe line on a wafer
Chiba,T. ; Komura,R. ; Mori,A.
Pub. info.: First International Symposium on Laser Precision Microfabrication : 14-16 June 2000, Omiya, Saitama, Japan.  pp.389-392,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4088