1.

Conference Proceedings
Conference Proceedings
1. Sensitivity improvements in uncooled microbolometer FPAs
Radford,W.A. ; Murphy,D.F. ; Finch,J.A. ; Hay,K. ; Kennedy,A. ; Ray,M. ; Sayed,A.A. ; Wyles,J. ; Wyles,R. ; Varesi,J. ; Moody,E.A. ; Cheung,F.
Pub. info.: Infrared technology and applications XXV : 5-9 April 1999, Orlando, Florida.  pp.119-130,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3698
2.

Conference Proceedings
Conference Proceedings
2. Microbolometer uncooled infrared camera with 20-mK NETD
Radford,W.A. ; Murphy,D.F. ; Finch,A. ; Kennedy,A. ; Kojiro,J.K. ; Ray,M. ; Wyles,R. ; Coda,R. ; Moody,E.A. ; Baur,S.
Pub. info.: Infrared Detectors and Focal Plane Arrays V : 14-17 April 1998, Orlando, Florida.  pp.22-35,  1998.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3379
3.

Conference Proceedings
Conference Proceedings
3. 320｡ﾟ240 silicon microbolometer uncooled IR FPAs with on-chip offset correction
Radford,W.A. ; Murphy,D. ; Ray,M. ; Propst,S.H. ; Kennedy,A. ; Kojiro,J.K. ; Woolaway,J.T. ; Soch,K.L. ; Coda,R. ; Lung,G. ; Moody,E.A. ; Gleichman,D. ; Baur,S.
Pub. info.: Infrared Detectors and Focal Plane Arrays IV : 10-11 April 1996, Orlando, Florida.  pp.82-92,  1996.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2746
4.

Conference Proceedings
Conference Proceedings
4. 320｡ﾟ240 microbolometer focal plane array for uncooled applications
Radford,W.A. ; Murphy,D. ; Ray,M. ; Propst,S.H. ; Kennedy,A. ; Soch,K.L. ; Coda,R. ; Lung,G. ; Moody,E.A. ; Gleichman,D.
Pub. info.: Photodetectors : materials and devices : 1-2 February 1996.  pp.80-90,  1996.  Bellingham, WA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2685