1.

Conference Proceedings

Conference Proceedings
Okada,S. ; Imade,M. ; Miyauchi,H. ; Miyoshi,T. ; Sumimoto,T. ; Yamamoto,H.
Pub. info.: Three-Dimensional Imaging and Laser-Based Systems for Metrology and Inspection II.  pp.58-65,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2909
2.

Conference Proceedings

Conference Proceedings
Yonezawa,T. ; Kinoshita,T. ; Ohtake,R. ; Nakajima,H. ; Miyauchi,H.
Pub. info.: Technologies for synthetic environments : hardware-in-the-loop testing IV : 5-7 April 1999, Orlando, Florida.  pp.120-127,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3697
3.

Conference Proceedings

Conference Proceedings
Takeda,F. ; Okada,S. ; Imade,M. ; Miyauchi,H.
Pub. info.: Process Control and Inspection for Industry.  4222  pp.417-426,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4222
4.

Conference Proceedings

Conference Proceedings
Kikuchi,M. ; Tamura,H. ; Ono,M. ; Miyauchi,H. ; Kobayashi,S.
Pub. info.: Automatic target recognition X : 26-28 April 2000, Orlando, USA.  pp.465-475,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4050