Kita, H. ; Higuchi, M. ; Miura, A. ; Kuriyama, T. ; Narisawa, I.
Pub. info.:
ANTEC 2000 Conference proceedings, May 7-11, 2000, Orlando, Florida. pp.3205-3208, 2000. Brookfield Center, CT. Society of Plastics Engineers, Inc. (SPE)
Title of ser.:
Annual Technical Conference - ANTEC : Society of Plastics Engineers Annual Technical Papers
Watanabe, H. ; Inada, T. ; Yoshiaki, K. ; Miura, A.
Pub. info.:
Sensors, systems, and next-generation satellites VI : 23-26 September 2002, Agia Pelagia, Crete, Greece. pp.104-110, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Fourth International Toki Conference on Plasma Physics and Controlled Nuclear Fusion : Satio Hayakawa Memorial Conference, 17-20 November, 1992, Toki, Japan : joint Varenna-Abastumani-ESA-Nagoya Workshop on Plasma Astrophysics. pp.189-194, 1993. Paris. ESA Publications Division
Proceedings of the Symposium on Environmental Aspects of Electrochemistry and photoelectrochemistry. pp.241-248, 1993. Pennington, NJ. Electrochemical Society
Miura, A. ; Fujino, Y. ; Taira, S. ; Ojima, T. ; Sakauchi, K.
Pub. info.:
A collection of the 21st AIAA International Communications Satellite Systems Conference and Exhibit technical papers, Yokohama, Japan, 15-19 April 2003. v. 1 pp.82-88, 2003. Reston, Va. American Institute of Aeronautics and Astronautics
Title of ser.:
AIAA Paper : AIAA International Communications Satellite Systems Conference
Sato, M. ; Li, H. ; Fujino, Y. ; Wakana, H. ; Miura, A. ; Ozaki, Y.
Pub. info.:
A collection of the 21st AIAA International Communications Satellite Systems Conference and Exhibit technical papers, Yokohama, Japan, 15-19 April 2003. v. 2 pp.768-776, 2003. Reston, Va. American Institute of Aeronautics and Astronautics
Title of ser.:
AIAA Paper : AIAA International Communications Satellite Systems Conference
Ikota, M. ; Miura, A. ; Fukunishi, M. ; Hiroi, T. ; Sugimoto, A.
Pub. info.:
Process and Materials Characterization and Diagnostics in IC Manufacturing. pp.50-60, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Nakasugi, T. ; Ando, A. ; Inanami, R. ; Sasaki, N. ; Ota, T. ; Nagano, O. ; Yamazaki, Y. ; Sugihara, K. ; Mori, I. ; Miyoshi, M. ; Okumura, K. ; Miura, A.
Pub. info.:
Emerging Lithographic Technologies VII. 2 pp.1051-1058, 2003. Bellingham, WA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Semiconductor and Organic Optoelectronic Materials and Devices. pp.391-398, 2000. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering