1.

Conference Proceedings

Conference Proceedings
Niwa, M. ; Mitsuhashi, R. ; Yamamoto, K. ; Hayashi, S. ; Rothchild, A. ; Kubicek, S. ; De Gendt, S. ; Biesemans, S.
Pub. info.: Defects in high-κ gate dielectric stacks : nano-electronic semiconductor devices.  pp.1-17,  2006.  Dordrecht.  Springer
Title of ser.: NATO science series. Series 2, Mathematics, physics and chemistry
Ser. no.: 220
2.

Conference Proceedings

Conference Proceedings
Niwa, M. ; Harada, Y. ; Yamamoto, K. ; Hayashi, S. ; Mitsuhashi, R. ; Eriguchi, K. ; Kubota, M. ; Hoshino, Y. ; Kido, Y ; Kwong, D.L.
Pub. info.: Rapid thermal and other short-time processing technologies III : proceedings of the international symposium.  pp.99-116,  2002.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2002-11