Michael, E. A. ; Mikulics, M. ; Marso, M. ; Kordos, P. ; Luth, H. ; Vowinkel, B. ; Schieder, R. ; Stutzki, J.
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Millimeter and submillimeter detectors for astronomy II : 23-25 June 2004, Glasgow, Scotland, United Kingdom. pp.525-536, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Mayorga, I. Camara ; Mikulics, M. ; Schmitz, A. ; Wal, P. Van der ; Guesten, R. ; Marso, M. ; Kords, P. ; Luth, H.
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Millimeter and submillimeter detectors for astronomy II : 23-25 June 2004, Glasgow, Scotland, United Kingdom. pp.537-547, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Zheng, X. ; Wu, S. ; Adam, R. ; Mikulics, M. ; Foerster, A. ; Schelten, J. ; Siegel, M. ; Kordos, P. ; Sobolewski, R.
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Advanced optical devices, technologies, and medical applications : 19-22 August 2002, Riga, Latvia. pp.68-78, 2003. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Adam, R. ; Mikulics, M. ; Wu, S. ; Zheng, X. ; Marso, M. ; Camara, I. ; Siebe, F. ; Gysten, R. ; Foerster, A. ; Kordos, P. ; Sobolewski, R.
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Ultrafast Phenomena in Semiconductors and Nanostructure Materials VIII. pp.321-332, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering