Single-electron transport through the Anderson center on Si(100)surface
- Author(s):
Bagraev,N.T. ( A.F.Ioffe Physical-Technical Institute ) Bouravleuv,A.D. Klyachkin,L.E. Malyarenko,A.M. Mikoushkin,V.M. Nikonov,S.Yu. Rykov,S.A. - Publication title:
- Third International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering : 7-11 June 1999, St. Petersburg, Russia
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 4064
- Pub. Year:
- 2000
- Page(from):
- 135
- Page(to):
- 139
- Pub. info.:
- Bellingham, Wash., USA: SPIE - The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819436993 [0819436992]
- Language:
- English
- Call no.:
- P63600/4064
- Type:
- Conference Proceedings
Similar Items:
SPIE-The International Society for Optical Engineering |
7
Conference Proceedings
Light emission from erbium-doped nanostructures embedded in silicon microcavities
SPIE-The International Society for Optical Engineering |
2
Conference Proceedings
Optical and magnetic properties for erbium-related centers in self-assembled silicon nanostructures
SPIE - The International Society for Optical Engineering |
Trans Tech Publications |
SPIE - The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
4
Conference Proceedings
Phase response of spin-dependent single-hole tunneling in silicon one-dimensional rings
SPIE-The International Society for Optical Engineering |
10
Conference Proceedings
Ballistic quantum wire conductance at nonzero temperature and finite longitudinal bias
SPIE-The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
11
Conference Proceedings
Infrared light irradiation diminishes effective charge transfer in slow sodium channel gating system
SPIE-The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
Trans Tech Publications |