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15 results

Conference Proceedings

1. In-Situ Determination of Si Wafer Contamination Using Photoconductance Decay Measurements*

Michel,J. ; Reddy,A.J. ; Norga,G.J. ; Platero,M. ; Kimerling,L.C.

Pub. info.:	Proceedings of the Electrochemical Society Symposium on Diagnostic Techniques for Semiconductor Materials and Devices. pp.212-222, 1997. Pennington, NJ. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3322

Conference Proceedings

2. Microholes in zirconia-coated Ni-superalloys for transpiration cooling of turbine blades

Horn,A. ; Weichenhain,R. ; Albrecht,S. ; Kreutz,E.W. ; Michel,J. ; Niessen,M. ; Kostrykin,V. ; Schulz,W. ; Etzkorn,A. ; Bobzin,K. ; Lugscheider,E. ; Poprawe,R.

Pub. info.:	High-power laser ablation III, 24-28 April 2000, Santa Fe, USA. pp.218-226, 2000. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4065

Conference Proceedings

3. High Sensitivity Detection of Silicon Surface Reactions by Photoconductance Decay

Norga,G.J. ; Black,M.R. ; Black,K.A. ; M'Saad,H. ; Michel,J. ; Kimerling,L.C.

Pub. info.:	Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995. pp.1531-1536, 1995. Zurich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	196-201

Conference Proceedings

4. ENDOR Investigations on Heat Treatment Centers in Oxygen Rich Si

Michel,J. ; Meilwes,N. ; Spaeth,J.-M.

Pub. info.:	Proceedings of the 15th International Conference on Defects in Semiconductors : Budapest, Hungary, August 22-26, 1988. Part2 pp.607-612, 1989. Aederlmannsdorf, Switzwelns. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	38-41

Conference Proceedings

5. Energy transfer processes at erbium ions in silicon

Michel,J. ; Palm,J. ; Chen,T. ; Duan,X. ; Oullette,E. ; Ahn,S.H. ; Nelson,S.F. ; Kimerling,L.C.

Pub. info.:	Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997. Part3 pp.1485-1490, 1997. Zurich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	258-263

Conference Proceedings

6. Erbium in Silicon:A Defect System for Optoelectronic Integrated Circuits

Michel,J. ; Palm,J. ; Gan,F. ; Ren,F.Y.G. ; Zheng,B. ; Dunham,S.T. ; Kimerling,L.C.

Pub. info.:	Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995. pp.585-590, 1995. Zurich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	196-201

Conference Proceedings

7. Iron in p-type silicon:A comprehensive model.(Invited)

Zhao,S. ; Smith,A.L. ; Ahn,S.H. ; Norga,G.J. ; Platero,M.T. ; Nakashima,H. ; Assali,L.V.C. ; Michel,J. ; Kimerling,L.C.

Pub. info.:	Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997. Part1 pp.429-436, 1997. Zurich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	258-263

Conference Proceedings

8. Silicon surface defects:the roles of passivation and surface contamination

Reddy,A.J. ; Burr,T.A. ; Chan,J.K. ; Norga,G.J. ; Michel,J. ; Kimerling,L.C.

Pub. info.:	Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997. Part3 pp.1719-1724, 1997. Zurich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	258-263

Conference Proceedings

9. The Physics and Application of Si:Er for Light Emitting Diodes

Michel,J. ; Ren,F.Y.G. ; Zheng,B. ; Jacobson,D.C. ; Poate,J.M. ; Kimerling,L.C.(invited)

Pub. info.:	Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993. Pt.2 pp.707-714, 1994. Zurich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	143-147

10.

Conference Proceedings

10. Photoluminescence of edge-defined film-fed growth silicon

Sawyer,W.D. ; Michel,J.

Pub. info.:	Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991. Pt.1 pp.291-296, 1992. Zurich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	83-87

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Author: Michel,J.