1.

Conference Proceedings
Conference Proceedings
1. GaSb on Si: Structural Defects and Their Effect on Surface Morphology and Electrical Properties
Shailesh Kumar Madisetti ; Vadim Tokranov ; Andrew Greene ; Steven Novak ; Michael Yakimov
Pub. info.: Compound semiconductor materials and devices : symposium held December 1-6, 2013, Boston, Massachusetts, U.S.A..  pp.115-120,  2014.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 1635
2.

Conference Proceedings
Conference Proceedings
2. Electron Scattering in Buried InGaAs MOSFET Channel with HfO₂ Gate Oxide
Serge Oktyabrsky ; Padmaja Nagaiah ; Vadim Tokranov ; sergei Koveshnikov ; Michael Yakimov ; Rama Kambhampati ; Richard Moore ; Wilman Tsai
Pub. info.: CMOS gate-stack scaling--materials, interfaces and reliability implications : symposium held April 14-16, 2009, San Francisco, California, U.S.A..  pp.125-130,  2009.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 1155
3.

Conference Proceedings
Conference Proceedings
3. Strained Quantum Wells for P-channel InGaAs CMOS
Padmaja Nagaiah ; Vadim Tokranov ; Michael Yakimov ; Serge Oktyabrsky
Pub. info.: Performance and reliability of semiconductor devices : symposium held November 30-December 3, 2008, Boston, Massachusetts, U.S.A..  pp.231-236,  2009.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 1108