1.

Conference Proceedings
Conference Proceedings
1. CONTACT-FREE DETERMINATION OF SCATTERING TIMES IN HETEROJUNCTION DEVICE STRUCTURES
Omling, P. ; Linke, H. ; Ramvall, P. ; Meyer, B.K.
Pub. info.: Semiconductor heterostructures for photonic and electronic applications : symposium held November 30-December 4, 1992, Boston, Massachusetts, U.S.A..  pp.115-120,  1993.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 281
2.

Conference Proceedings
Conference Proceedings
2. ALLOY DEPENDENT PROPERTIES OF EXCITONS AND DEEP ACCEPTORS IN CdZnTe VOLUME CRYTALS
Meyer, B.K. ; Hofmann, D.F. ; Oettinger, K. ; Stadler, W. ; Efros, Al. L. ; Salk, M. ; Benz, K.W.
Pub. info.: Wide band gap semiconductors : symposium held December 2-6, 1991, Boston, Massachusetts, U.S.A..  pp.209-214,  1992.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 242
3.

Conference Proceedings
Conference Proceedings
3. ELECTRON SPIN RESONANCE INVESTIGATIONS OF RAPID THERMAL OXIDIZED POROUS SILICON
Linke, H. ; Omling, P. ; Meyer, B.K. ; Petrova-Koch, V. ; Muschik, T. ; Lehmann, V.
Pub. info.: Microcrystalline semiconductors : materials science & devices : symposium held November 30-December 4, 1992, Boston, Massachusetts, U.S.A..  pp.251-256,  1993.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 283
4.

Conference Proceedings
Conference Proceedings
4. QUALITY OF BULK CdTe SUBSTRATES AND ITS RELATION TO INTRINSIC DEFECTS
Meyer, B.K. ; Hofmann, D.M. ; Stadler, W. ; Emanuelsson, P. ; Omling, P. ; Weigel, E. ; Muller-Vogt, G. ; Wienecke, F. ; Schenk, M.
Pub. info.: Infrared detectors : materials, processing, and devices : symposium held April 14-16, 1993, San Francisco, California, U.S.A..  pp.185-190,  1994.  Pittsburgh, PA.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 299
5.

Conference Proceedings
Conference Proceedings
5. OPTICAL INVESTIGATIONS ON DONOR DOPED CdTe
Stadler, W. ; Meyer, B.K. ; Hofmann, D.M. ; Sinerius, D. ; Benz, K.W.
Pub. info.: Defects in materials : symposium held November 26-29, 1990, Boston, Massachusetts, U.S.A..  pp.445-450,  1991.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 209
6.

Conference Proceedings
Conference Proceedings
6. OPTICAL AND MAGNETIC RESONANCE INVESTIGATIONS OF MERCURIC IODIDE CRYSTALS
Meyer, B.K. ; Hofmann, D.M. ; Eckstein, J. ; Benz, K.W.
Pub. info.: Wide band gap semiconductors : symposium held December 2-6, 1991, Boston, Massachusetts, U.S.A..  pp.773-778,  1992.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 242
7.

Conference Proceedings
Conference Proceedings
7. PROPERTIES OF GaInAsP ALLOYS INVESTIGATED BY OPTICALLY DETECTED MAGNETIC RESONANCE TECHNIQUES
Wetzel, C. ; Meyer, B.K. ; Grutzmacher, D. ; Omling, P.
Pub. info.: Long-wavelength semiconductor devices, materials, and processes : symposium held November 26-29, 1990, Boston, Massachusetts, U.S.A..  pp.353-358,  1991.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 216
8.

Conference Proceedings
Conference Proceedings
8. Layer by Layer Growth of GaN Films by Low Temperature Cyclic Process
Sanguino, P. ; Koynov, S. ; Niehus, M. ; Melo, L.V. ; Schwarz, R. ; Alves, H. ; Meyer, B.K.
Pub. info.: GaN and related alloys - 2001 : symposium held November 26-30, 2001, Boston, Massachusetts, U.S.A..  pp.81-86,  2002.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 693
9.

Conference Proceedings
Conference Proceedings
9. Spin Dependent Recombination in Si p-n Junctions
Meyer, B.K. ; Christmann, P. ; Stadler, W. ; Overhof, H. ; Spaeth, J-M. ; Greulich-Weber, S. ; Stich, B.
Pub. info.: Proceedings of the Symposium on the Degradation of Electronic Devices due to Device Operation as well as Crystalline and Process-Induced Defects.  pp.221-234,  1994.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 1994-1