1.

Conference Proceedings

Conference Proceedings
Meyendorf, N. ; Berthold, A.
Pub. info.: Advanced sensor technologies for nondestructive evaluation and structural health monitoring II : 1-2 March 2006, San Diego, California, USA.  pp.617901-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6179
2.

Conference Proceedings

Conference Proceedings
Kroening, M. ; Berthold, A. ; Meyendorf, N.
Pub. info.: Advanced sensor technologies for nondestructive evaluation and structural health monitoring : 8-10 March 2005, San Diego, California, USA.  pp.149-151,  2005.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5770
3.

Conference Proceedings

Conference Proceedings
Meyendorf, N. ; Altpeter, I. ; Netzelmann, U. ; Hoffmann, J. ; Nichtl-Pecher, W. ; Grimm, H.
Pub. info.: Nondestructive methods for materials characterization : symposium held November 29-30, 1999, Boston, Massachusetts, U.S.A..  pp.145-,  2000.  Warrendale, Pa..  MRS-Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 591
4.

Conference Proceedings

Conference Proceedings
Rosner, H. ; Meyendorf, N. ; Sathish, S. ; Matikas, T. E.
Pub. info.: Nondestructive methods for materials characterization : symposium held November 29-30, 1999, Boston, Massachusetts, U.S.A..  pp.73-,  2000.  Warrendale, Pa..  MRS-Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 591
5.

Conference Proceedings

Conference Proceedings
Hoffmann, J. ; Sathish, S. ; Khobaib, M. ; Meyendorf, N. ; Netzelmann, U. ; Matikas, T. E.
Pub. info.: Nondestructive methods for materials characterization : symposium held November 29-30, 1999, Boston, Massachusetts, U.S.A..  pp.67-,  2000.  Warrendale, Pa..  MRS-Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 591
6.

Conference Proceedings

Conference Proceedings
Siddoju, A. ; Kuhr, S.J. ; Meyendorf, N.
Pub. info.: Testing, Reliability, and Application of Micro- and Nano-Material Systems.  pp.247-253,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5045
7.

Conference Proceedings

Conference Proceedings
Meyendorf, N. ; Michel, B.
Pub. info.: Testing, Reliability, and Application of Micro- and Nano-Material Systems.  pp.47-53,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5045
8.

Conference Proceedings

Conference Proceedings
Siddoju, A. ; Meyendorf, N. ; Haupert, M. ; David, P.
Pub. info.: Testing, Reliability, and Application of Micro- and Nano-Material Systems.  pp.241-246,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5045
9.

Conference Proceedings

Conference Proceedings
Hoffmann, J. ; Kramb, V. ; Johnson, J. ; Meyendorf, N.
Pub. info.: Nondestructive Evaluation and Reliability of Micro- and Nanomaterial Systems.  pp.129-136,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4703
10.

Conference Proceedings

Conference Proceedings
Roesner, H. ; Meyendorf, N.
Pub. info.: Nondestructive Evaluation and Reliability of Micro- and Nanomaterial Systems.  pp.146-153,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4703