1.

Conference Proceedings
Conference Proceedings
1. ANOMALOUS IRON AND CHROMIUM CONTAMINATION FROM BOE
Hockett, R.S. ; Metz, J.M. ; Ritterbush, L. ; Torry, P. ; Corrado, J.
Pub. info.: Proceedings of the Symposium on Contamination Control and Defect Reduction in Semiconductor Manufacturing III.  pp.315-322,  1994.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 1994-9
2.

Conference Proceedings
Conference Proceedings
2. Ratio of the spherical and flat detectors at tissue surfaces during pleural photodynamic therapy (Invited Paper)
Zhu, T.C. ; Friedberg, J.S. ; Dimofte, A. ; Miles, J.D. ; Metz, J.M. ; Glatstein, J.M. ; Hahn, S.M.
Pub. info.: Optical methods for tumor treatment and detection : mechanisms and techniques in photodynamic therapy XI : 19-20 January 2002, San Jose, USA.  pp.102-113,  2002.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4612
3.

Conference Proceedings
Conference Proceedings
3. Comparison of Wafer Cassette Contamination Using Multi-Techniques
Metz, J.M. ; Radicati, F. ; Craig, A.Y. ; Hockett, R.S.
Pub. info.: Proceedings of the Symposium on Contamination Control and Defect Reduction in Semiconductor Manufacturing II.  pp.132-142,  1994.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 1994-3
4.

Conference Proceedings
Conference Proceedings
4. In-vivo measurements of penetration depth, oxygenation, and drug concentration using broadband absorption spectroscopy in human tissues before and after photodynamic therapy
Wang, H.-W. ; Zhu, T.C. ; Solonenko, M. ; Hahn, S.M. ; Metz, J.M. ; Dimofte, A. ; Mile, J. ; Yodh, A.G.
Pub. info.: Optical Methods for Tumor Treatment and Detection: Mechanisms and Techniques in Photodynamic Therapy XII.  pp.68-75,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4952