Merken P. ; Souverijns T. ; Putzeys J. ; Creten Y. ; Van Hoof C.
Pub. info.:
Millimeter and submillimeter detectors and instrumentation for astronomy III : 29-31 May, 2006, Orlando, Florida, USA. pp.627516-627516, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering